An Electrical-performance Test Method for Test Handler

Electrical-performance test (hereafter referred to as E-test) has always been one of the difficulties in final testing procedures for semiconductor. The accuracy, rapidity and generality are difficult to achieve in the E-test. This paper proposes a test method based on the characteristics of the E-test workstation of test handler for semiconductor, in which the whole test procedure is divided into two terminals: the control and the test terminal. The control terminal is integrated into the control system of test handler, while the test terminal is independently designed with generality for different semiconductor products. To achieve an ideal performance, the parallel work trait of E-test in this method is discussed. Finally, the method has been successfully implemented on the test handler for semiconductor in actual production.