Reflectometry studies of the coherent properties of neutrons

被引:4
|
作者
Korneev, DA
Bodnarchuk, VI [1 ]
Yaradaikin, SP
Peresedov, VF
Ignatovich, VK
Menelle, A
Gaehler, R
机构
[1] Joint Inst Nucl Res, Frank Lab Neutron Phys, Dubna 141980, Russia
[2] Leon Brillouin Lab, Saclay, France
[3] Tech Univ Munich, D-8000 Munich, Germany
来源
PHYSICA B | 2000年 / 276卷
关键词
coherence length; reflectometry; thin films;
D O I
10.1016/S0921-4526(99)01689-0
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Thin him is a high resolution neutron interferometer because in it there occur the interference of two waves reflected from two interfaces. If the neutron is characterized by the wave packet with the centre of gravity moving at velocity v, for the incidence on the film at some angle, due to the component of the momentum parallel to the entrance surface the exit point of the neutron on reflection from the back interface shifts along the surface with respect to the entrance point. This shift is depended on the momentum transfer q and analyzing of experimental dependence of the reflectivity R on q it possible to get into the region where a transition from wave to corpuscular properties takes place and thus it allows to estimate the lateral coherence length of the neutron. In this work it makes the lower estimation of the lateral coherence length of the neutron from the time-of-flight reflectometry experiment with copper film on glass substrate and gives comparison with other experimental estimation of this value (U. Bonse, W. Graeff, H. Rauch, Phys. Lett. 69A, N.6 (1979)). (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:973 / 974
页数:2
相关论文
共 50 条
  • [1] Opportunities in the use of Very Cold Neutrons in reflectometry techniques
    Ott, Frederic
    JOURNAL OF NEUTRON RESEARCH, 2022, 24 (02) : 211 - 221
  • [2] MODE HOPPING NOISE IN COHERENT FMCW REFLECTOMETRY
    PASSY, R
    GISIN, N
    VONDERWEID, JP
    ELECTRONICS LETTERS, 1992, 28 (23) : 2186 - 2188
  • [3] Characterization of thin layer SnO2/glass by neutrons reflectometry
    Khelladi, M. F.
    Izerrouken, M.
    Kermadi, S.
    Tala-Ighil, R.
    Sali, S.
    Boumaour, M.
    THIN FILMS AND POROUS MATERIALS, 2009, 609 : 155 - +
  • [4] Extraction of quasi-coherent modes based on reflectometry data
    Salazar, Luigui
    Heuraux, Stephane
    Sabot, Roland
    Kramer-Flecken, Andreas
    PLASMA PHYSICS AND CONTROLLED FUSION, 2022, 64 (10)
  • [5] External Modulation Optical Coherent Domain Reflectometry with Long Measurement Range
    Xue, Yinghong
    Niu, Yueping
    Gong, Shangqing
    SENSORS, 2021, 21 (16)
  • [6] Poloidal correlation reflectometry at W7-X: radial electric field and coherent fluctuations
    Windisch, T.
    Kraemer-Flecken, A.
    Velasco, J. L.
    Koenies, A.
    Nuehrenberg, C.
    Grulke, O.
    Klinger, T.
    PLASMA PHYSICS AND CONTROLLED FUSION, 2017, 59 (10)
  • [7] H-mode filament studies with reflectometry in ASDEX upgrade
    Vicente, J.
    Conway, G. D.
    Manso, M. E.
    Mueller, H. W.
    Silva, C.
    da Silva, F.
    Guimarais, L.
    Silva, A.
    PLASMA PHYSICS AND CONTROLLED FUSION, 2014, 56 (12)
  • [8] Polarised neutron reflectometry studies of flux penetration in superconducting Nb
    Reynolds, JM
    Nunez, V
    Boothroyd, AT
    Somekh, R
    Bucknall, DG
    Langridge, S
    PHYSICA B, 1997, 241 : 1104 - 1106
  • [9] GPS Diffractive Reflectometry: Footprint of a Coherent Radio Reflection Inferred From the Sensitivity Kernel of Multipath SNR
    Geremia-Nievinski, Felipe
    Ferreira e Silva, Matheus
    Boniface, Karen
    Galera Monico, Joao Francisco
    IEEE JOURNAL OF SELECTED TOPICS IN APPLIED EARTH OBSERVATIONS AND REMOTE SENSING, 2016, 9 (10) : 4884 - 4891
  • [10] Local birefringence measurements in single-mode fibers with coherent optical frequency-domain reflectometry
    Huttner, B
    Reecht, J
    Gisin, N
    Passy, R
    von der Weid, JP
    IEEE PHOTONICS TECHNOLOGY LETTERS, 1998, 10 (10) : 1458 - 1460