Charge Transport in a Double-Layered Enamel Insulation during Surface Potential Decay

被引:4
作者
Hoang, Anh T. [1 ,2 ]
Serdyuk, Yuriy V. [1 ]
Gubanski, Stanislaw M. [1 ]
机构
[1] Chalmers Univ Technol, Dept Elect Engn, SE-41296 Gothenburg, Sweden
[2] NKT High Voltage Cables, SE-37123 Karlskrona, Sweden
关键词
Surface potential decay; enamel insulation; charge injection; charge transport; insulation insulation interface; Maxwell-Wagner-Sillars polarization; POLYETHYLENE FILMS; MODEL; MOBILITY;
D O I
10.1109/TDEI.2018.006976
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work presents a numerical model for studying charge dynamics during decay of pre-deposited surface charges on an enamel insulation comprising two layers of different materials. It is shown that the considered surface charge decay is dominated by charge injection from insulation surface into the bulk and the drift of injected carriers along the direction of induced electric field. These features allow for estimating charge carriers' mobilities in the studied insulation. The developed model incorporates experimental outcomes as well as the proposed effect of an internal interface between insulating layers on hindering charge transport through the bulk. The transient process of charge accumulation at the internal interface is exhibited and correlated with the well-known Maxwell Wagner Sillars polarization model. Contribution of charge injection at each insulation surface into the bulk to the measured potential decay is evaluated and compared.
引用
收藏
页码:702 / 712
页数:11
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