High-Resolution Detection of Wavelength Shift Induced by an Erbium-Doped Fiber Bragg Grating

被引:3
作者
Kai, Li [1 ]
Sun, Junqiang [1 ]
Gao, Ya [2 ]
机构
[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Sch Opt & Elect Informat, Wuhan 430074, Peoples R China
[2] Zhengzhou Univ, Sch Phys & Microelect, Zhengzhou 450001, Peoples R China
基金
中国国家自然科学基金;
关键词
Amplitude modulation; Optical fibers; Optical filters; Optical reflection; Optical pumping; Notch filters; optical pumping; phase modulation; wavelength measurement; INTERROGATION TECHNIQUE; SENSOR; STRAIN; TEMPERATURE; PASSBAND;
D O I
10.1109/JLT.2020.3024648
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We analyze theoretically and verify experimentally a high-resolution and low-cost method to detect wavelength shift induced by an Erbium-doped fiber Bragg grating. A pi-phase-shifted fiber Bragg grating on a temperature controlling setup is employed to achieve tunable single-sideband modulation. To further enhance measurement stability and diminish operational complexity, an asymmetric phase-shifted fiber Bragg grating is developed to reflect wide single-sideband modulation signals and avoid the tuning of the optical carrier wavelength. Through the using of microwave photonics technique, the wavelength shift of the Erbium-doped fiber Bragg grating induced by laser pumping is mapped onto the amplitude variation of the beat signal. The results indicate 1 GHz frequency shift, corresponding to 0.008 nm wavelength shift in the 1550 nm band, is able to be detected. The resolution can be further improved by using a more accurate temperature controlling system. Furthermore, our approach offers an alternative method to detect weak temperature and strain changes on chips or other sensing systems with high accuracy.
引用
收藏
页码:275 / 281
页数:7
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