Quantification of elements in copper-zinc ores at micro- and macro-levels by total reflection X-ray fluorescence and inductively coupled plasma atomic emission spectrometry

被引：16

作者：

Sharanov, Pavel Yu. ^{[1
]}

Volkov, Dmitry S. ^{[1
]}

Alov, Nikolai V. ^{[1
]}

机构：

[1] Lomonosov Moscow State Univ, Dept Chem, Moscow 119991, Russia

来源：

ANALYTICAL METHODS | 2019年 / 11卷 / 29期

基金：

俄罗斯科学基金会;

关键词：

Silica;

D O I：

10.1039/c9ay01055f

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A new approach for the direct determination of the elemental composition of sulfide and oxide copper-zinc ores in the solid state by total reflection X-ray fluorescence spectrometry (TXRF) is proposed. This approach based on the preparation of suspensions in high viscosity liquids without a sample digestion stage. Samples with different matrices, FeS2 and SiO2, are considered. The sample preparation issues are discussed in detail. The results obtained by TXRF are validated by a well-known analytical technique, inductively coupled plasma atomic emission spectrometry. It is shown that TXRF can be used for the quantification of the most important elements in copper-zinc ores: S, Fe, Cu, Zn and As.

引用

页码：3750 / 3756

页数：7