Electrochemical growth and characterization of tin oxide thin films

被引：0

作者：

Reddy, V. Ashok ^{[1
]}

Thanikaikarasan, S. ^{[2
]}

Marjorie, S. Roji ^{[1
]}

机构：

[1] Saveetha Univ, Saveetha Sch Engn, Dept Elect & Commun Engn, Chennai 602105, Tamil Nadu, India

[2] Saveetha Univ, Saveetha Sch Engn, Dept Sci & Humanities, Div Phys, Chennai 602105, Tamil Nadu, India

来源：

MATERIALS TODAY-PROCEEDINGS | 2020年 / 33卷

关键词：

Electrodeposition; Metal Oxides; Thin films; X-ray diffraction; Scanning electron microscope; Rutile structure; SNO2; NANOTUBES;

D O I：

10.1016/j.matpr.2020.05.284

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The main objective of the present investigation is to identify the typical features of Tin Oxide thin films. The versatile electrodeposition technique has been employed to prepare Tin Oxide thin film on Stainless Steel substrate. Structural features showed that the deposited films have tetragonal structure with orientation along (2 1 1) plane. The parameters such as crystallite size and dislocation density has been estimated for the deposited films. Morphological features with film composition of the deposited films are analyzed using an Energy Dispersive X-ray analysis with Scanning electron microscopy. The experimental observations are discussed. (C) 2019 Elsevier Ltd. All rights reserved.

引用

页码：3417 / 3419

页数：3

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