Microstrip Step Discontinuities on Single and Multilayer Dielectric Substrates

被引：0

作者：

Singh, Himanshu ^{[1
]}

Verma, A. K. ^{[1
]}

机构：

[1] Univ Delhi, Dept Elect Sci, New Delhi 110021, India

来源：

INTERNATIONAL CONFERENCE ON RECENT ADVANCES IN MICROWAVE THEORY AND APPLICATIONS, PROCEEDINGS | 2008年

关键词：

Microstrip step; Step discontinuity; multidimensional logistic curve fitting; Closed-form model;

D O I：

10.1109/AMTA.2008.4763042

中图分类号：

Q6 [生物物理学];

学科分类号：

071011 ;

摘要：

We present a model on the based of K.C. Gupta proposal for inductance and capacitance for epsilon(r) = 9.6 epsilon(r) = 4.0 respectively for single layer and compare the numerical calibration with de-embedding techniques used in the planar electromagnetic (EM) simulation (SONNET) for epsilon(r) = 2.3, 4.0, 15.1, 20.0 & 40.0. We change the model for multilayer and compare with present model for epsilon(r) = 12.0 and epsilon(r) = 3.5.

引用

页码：735 / 738

页数：4

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