Two beam collection mode photon scanning tunneling microscope

被引：2
作者：
Kawanishi, T
Tamada, K
Kitano, M
机构：
[1] Dept. of Electronics and Commun., Kyoto University, Kyoto, 606-01, Yoshidahonmachi, Sakyoku
来源：
OPTICAL REVIEW | 1997年 / 4卷 / 05期
关键词：
photon scanning tunneling microscope; evanescent wave; inclination of surface; deformation of image; near field;
D O I：
10.1007/s10043-997-0601-4
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We studied the image deformation due to the surface inclination of objects in photon scanning tunnelling microscopes (PSTM). A novel collection mode PSTM with two light sources is proposed to reduce the deformation and experimental results show that the PSTM system is effective.
引用
收藏
页码：601 / 604
页数：4
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