Nanoscale current modulations in Pr0.7Ca0.3MnO3 thin films

被引：6
作者：
Moon, Hak B.
Kim, Cheol H.
Ahn, Jai S.
Cho, Jin H. [1 ]
机构：
[1] RCDAMP, Pusan 609735, South Korea
[2] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea
来源：
JOURNAL OF PHYSICAL CHEMISTRY B | 2006年 / 110卷 / 48期
关键词：
D O I：
10.1021/jp066237k
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Many theoretical and experimental efforts have been focused on the origin of the electric-pulse-induced resistance change effect. However, there are still various reports of the origin supporting either the bulk nature or the interface nature. To resolve the controversies, nanoscale electronic measurements may provide essential clues. In this work, we report microscopic electrical properties of Pr0.7Ca0.3MnO3 thin films. The resistance of a single-crystalline grain is not homogeneous in nanometer scale. We deduce that nanoscale inhomogeneity is related to the periodic relaxation of substrate-induced strain, which is caused by the lattice mismatch between the substrate and the thin film.
引用
收藏
页码：24277 / 24280
页数：4
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