On the Accuracy of the Parameters Extracted From S-Parameter Measurements Taken on Differential IC Transmission Lines

被引：9
|
作者：
Tiemeijer, Luuk F. [1 ]
Pijper, Ralf M. T. [1 ]
van Noort, Wibo [2 ]
机构：
[1] NXP Semicond Taiwan Semicond Mfg Co, Res Ctr, NL-5656 AE Eindhoven, Netherlands
[2] Natl Semicond Corp, Portland, ME 04106 USA
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2009年 / 57卷 / 06期
关键词：
Deembedding; integrated circuits; on-chip interconnect transmission lines; on-wafer microwave measurements; WAFER RF CHARACTERIZATION; PROPAGATION CONSTANT;
D O I：
10.1109/TMTT.2009.2020821
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we compare the accuracy of the telegrapher's equation transmission line parameters extracted with different methods from deembedded S-parameter measurements taken on differential integrated circuit transmission lines. We present a mathematical proof that conventional "open-short" deembedding is sufficient to extract the intrinsic propagation constant gamma of the transmission line, but that at the same time, some deembedding errors will remain for the extracted characteristic impedance Z(0). We illustrate this by comparing experimental results obtained after "open-short" and "short-open" deembedding, and explain that as a result of this, using either known capacitance/known conductance or known inductance/known resistance approximations to study the remaining transmission line parameters can be attractive.
引用
收藏
页码：1581 / 1588
页数：8
相关论文
共 50 条
  • [21] Validation of equivalent circuits extracted from S-parameter data for eye-pattern evaluation
    Selli, G
    Lai, M
    Fan, J
    Antonini, G
    Archambeault, B
    2004 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD 1-3, 2004, : 666 - 671
  • [22] Differential uncertainty analysis for evaluating the accuracy of S-parameter retrieval methods for electromagnetic properties of metamaterial slabs
    Hasar, Ugur Cem
    Barroso, Joaquim J.
    Sabah, Cumali
    Kaya, Yunus
    Ertugrul, Mehmet
    OPTICS EXPRESS, 2012, 20 (27): : 29002 - 29022
  • [23] An accurate determination of the characteristic impedance of lossy lines on chips based on high frequency S-parameter measurements
    Winkel, TM
    Dutta, LS
    Grabinski, H
    1996 IEEE MULTI-CHIP MODULE CONFERENCE, PROCEEDINGS, 1996, : 190 - 195
  • [24] Improved S-parameter Measurements of Embedded Planar Transmission-Line on Multi-layer PCB
    Koo, Hyunji
    Salter, Martin J.
    Hong, Young-Pyo
    2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018), 2018,
  • [25] Parameter extraction of heterojunction bipolar transistor from low-frequency noise and S-parameter measurements
    Penarier, A.
    Jarrix, S. G.
    Perotin, M.
    Pascal, F.
    Delseny, C.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2007, 22 (05) : 492 - 496
  • [26] DETERMINATION OF PARAMETERS OF MICROWAVE TRANSMISSION-LINES FROM TRANSMISSION AND REFLECTION MEASUREMENTS
    COURT, RA
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1977, 26 (04) : 419 - 420
  • [27] On the Validity of Single-Ended Mixed-Mode S-Parameter Measurements for Differential Active Devices
    Schmitz, O.
    Hampel, S. K.
    Rabe, H.
    Simon, J.
    Rolfes, I.
    2009 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, 2009, : 691 - +
  • [28] A new critical dimension metrology for chrome-on-glass substrates based on S-parameter measurements extracted from coplanar waveguide test structures
    Nwokoye, Chidubem A.
    Zaghloul, Mona
    Cresswell, Michael W.
    Allen, Richard A.
    Murabito, Christine E.
    PHOTOMASK TECHNOLOGY 2006, PTS 1 AND 2, 2006, 6349
  • [29] Design of Verification Standards for S-parameter Measurements from 110 GHz to 170 GHz
    Liu Jie
    Yang Chuntao
    Chen Ting
    Zhang Na
    Cheng Chunyue
    Ma Hongmei
    2020 XXXIIIRD GENERAL ASSEMBLY AND SCIENTIFIC SYMPOSIUM OF THE INTERNATIONAL UNION OF RADIO SCIENCE, 2020,
  • [30] Parameter Extraction of Asymmetric Reciprocal Transmission Lines (ARTLs) From Scattering Parameters With Transmission-Line-Based Analyses of Differential Antennas
    Anusorn, Taran
    Sukpreecha, Kitiphon
    Kawdungta, Supakit
    Janpugdee, Panuwat
    Torrungrueng, Danai
    IEEE ACCESS, 2024, 12 : 141052 - 141063
12345