DIV-TBAT algorithm for test suite reduction in software testing

被引:6
作者
Sugave, Shounak Rushikesh [1 ]
Patil, Suhas Haribhau [2 ]
Reddy, B. Eswara [3 ]
机构
[1] JNTUA, Ananthapuramu, Andhra Pradesh, India
[2] Bharati Vidyapeeth Univ, Coll Engn, Pune, Maharashtra, India
[3] JNTUA Coll Engn, Kalikiri, Andhra Pradesh, India
关键词
program testing; genetic algorithms; greedy algorithms; search problems; software maintenance; Boolean functions; mathematics computing; regression testing; redundant test cases; test suite reduction; reduced test suite; DIV-TBAT algorithm; software testing; ATAP measure; greedy search algorithm; Boolean logic; GREEDY APPROACH;
D O I
10.1049/iet-sen.2017.0130
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Researchers have investigated different approaches to maintain the minimum cost and effort in regression testing. Here, test suite reduction is a common technique to decrease the cost of regression testing by removing the redundant test cases from the test suite and then, obtaining a representative set of test cases that still yield a high level of code coverage. Accordingly, here, the authors have developed two various techniques for test suite reduction. In the first technique, ATAP measure is newly developed to find the reduced test suite with the help of greedy search algorithm. In the second technique, DIV-TBAT (DIVersity-based BAT) algorithm is newly devised based on the mechanisms of Boolean logic within BAT algorithm which improve diversity during the search process. The proposed techniques are experimented using eight programs from SIR subject programs and the performance study is conducted using nine different evaluation metrics based on different research questions. The comparative analysis is performed with the existing algorithms like GreedyRatio, GreedyEIrreplaceability, diversity-based genetic algorithm, TBAT, and TAP, to prove the performance improvement over the eight software programs considered.
引用
收藏
页码:271 / 279
页数:9
相关论文
共 25 条
[1]  
[Anonymous], 2005, ACM SIGSOFT SOFTW EN
[2]  
Bryce RC, 2005, PROC INT CONF SOFTW, P146
[3]   A simulation study on some heuristics for test suite reduction [J].
Chen, TY ;
Lau, MF .
INFORMATION AND SOFTWARE TECHNOLOGY, 1998, 40 (13) :777-787
[4]   A new heuristic for test suite reduction [J].
Chen, TY ;
Lau, MF .
INFORMATION AND SOFTWARE TECHNOLOGY, 1998, 40 (5-6) :347-354
[5]   Constructing interaction test suites for highly-configurable systems in the presence of constraints: A greedy approach [J].
Cohen, Myra B. ;
Dwyer, Matthew B. ;
Shi, Jiangfan .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2008, 34 (05) :633-650
[6]  
De Lucia A., 2012, 2012 Proceedings of 7th International Workshop on Automation of Software Test (AST 2012), P145, DOI 10.1109/IWAST.2012.6228983
[7]   A test-suite reduction approach to improving fault-localization effectiveness [J].
Gong Dandan ;
Wang Tiantian ;
Su Xiaohong ;
Ma Peijun .
COMPUTER LANGUAGES SYSTEMS & STRUCTURES, 2013, 39 (03) :95-108
[8]  
Harris P, 2015, INT ARAB J INF TECHN, V12, P17
[9]  
Harrold M. J., 1993, ACM Transactions on Software Engineering and Methodology, V2, P270, DOI 10.1145/152388.152391
[10]   Achieving Scalable Model-Based Testing Through Test Case Diversity [J].
Hemmati, Hadi ;
Arcuri, Andrea ;
Briand, Lionel .
ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, 2013, 22 (01)