Energy dependent sensitivity of microchannel plate detectors

被引:53
作者
Rochau, G. A.
Bailey, J. E.
Chandler, G. A.
Nash, T. J.
Nielsen, D. S.
Dunham, G. S.
Garcia, O. F.
Joseph, N. R.
Keister, J. W.
Madlener, M. J.
Morgan, D. V.
Moy, K. J.
Wu, M.
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
[2] Ktech Corp Inc, Albuquerque, NM 87123 USA
[3] Brookhaven Natl Lab, SFA Inc, Upton, NY 11973 USA
[4] Bechtel Nevada, Las Vegas, NV 89193 USA
关键词
D O I
10.1063/1.2336461
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Understanding of microchannel plate (MCP) detectors with x-ray energy is important for applications in high energy density research such as broadband imaging and x-ray spectroscopy. The relative sensitivity with photon energy for Cu/ Au coated MCPs in the range of 250 eV < hv < 5000 eV has been measured at the National Synchrotron Light Source. A model of this response that includes contributions from secondary photoelectron yield and interactions with multiple channels is presented. This model is shown to agree with the measured MCP response to < 20% over the majority of the spectral range using cross sections determined from an independent analysis of the MCP glass composition. (c) 2006 American Institute of Physics.
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页数:4
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