Research for Testing Parallel Quantum Hall Samples with Automatic Cryogenic Current Comparator Instrument

被引:0
|
作者
Cai Jianzhen [1 ]
Huang Xiaoding [1 ]
Tong Yazhen [1 ]
Song Jiayun [1 ]
机构
[1] Beijing Orient Inst Measurement, Beijing 100086, Peoples R China
来源
ISTAI 2016: PROCEEDINGS OF THE SIXTH INTERNATIONAL SYMPOSIUM ON TEST AUTOMATION & INSTRUMENTATION | 2016年
关键词
cryogenic current comparator; parallel quantum hall sample; disspation;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, the Quantum Hall Resistance effect and parallel Quantum Hall Resistance sample are introduced. For testing parallel Quantum Hall Resistance sample, the longitudinal resistance or longitudinal voltage is need to be measured. However, the parallel Quantum Hall Resistance sample is need to be carefully handled with electronic circuit, in that case the ordinary instrument such as Keithley 2182A or Agilent 34420A powered by 220V are not allowed to be introduced into the sample circuit. Any small leakage and current may injure the quantized condition of the parallel Quantum Hall samples. We suggest a series of method to test the parallel Quantum Hall samples with a method of using automatic CCC instrument. Cryogenic Current Comparator is a kind ultra-high precision instrument measuring the ratio of two standard resistors in metrology, with ratio error reaching to 10-9 order, in addition the Cryogenic Current Comparator can be used as a nano voltage meter to test parallel Quantum Hall. In recent years,. several kinds of automatic Cryogenic Current Comparator devices have been developed in the world. In this paper, we introduce a parallel Quantum Hall samples testing system with automatic Cryogenic Current Comparator and testing method.
引用
收藏
页码:112 / 116
页数:5
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