Resonant soft x-ray scattering from structured polymer nanoparticles

被引：65

作者：

Araki, Tohru

Ade, Harald ^{[1
]}

Stubbs, Jeffrey M.

Sundberg, Donald C.

Mitchell, Gary E.

Kortright, Jeffrey B.

Kilcoyne, A. L. D.

机构：

[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

[2] Univ New Hampshire, Nanostruct Polymers Res Ctr, Durham, NH 03824 USA

[3] Dow Chem Co USA, Midland, MI 48667 USA

[4] Lawrence Berkeley Natl Lab, Div Sci Mat, Berkeley, CA 94720 USA

[5] Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 12期

关键词：

D O I：

10.1063/1.2356306

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The application of resonant soft x-ray scattering to chemically heterogeneous soft condensed matter materials is presented. Two structured styrene-acrylic polymer composite latex particles similar to 230 nm in diameter were utilized to delineate the potential utility of this technique. Angular scans at photon energies corresponding to strong scattering contrast between specific chemical moieties made it possible to infer the effective radii that correspond to the two polymer phases in the nanoparticles. The results show that resonant soft x-ray scattering should be a powerful complementary tool to neutron and hard x-ray scattering for the characterization of structured soft condensed matter nanomaterials. (c) 2006 American Institute of Physics.

引用

页数：3

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