Analysis of Metrological Test Method Accuracy

被引：0

作者：

Abramov, Aleksey M. ^{[1
]}

Gurzhin, Sergey G. ^{[1
]}

Zhulev, Vladimir, I ^{[1
]}

Proshin, Evgeniy M. ^{[1
]}

Shulyakov, Andrey, V ^{[1
]}

机构：

[1] Ryazan State Radio Engn Univ, Fac Automat & Informat Technol Control, Ryazan, Russia

来源：

2020 9TH MEDITERRANEAN CONFERENCE ON EMBEDDED COMPUTING (MECO) | 2020年

关键词：

method errors; non-linearity; digital measurement module; standard test signal; conversion function;

D O I：

10.1109/meco49872.2020.9134095

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

the article gives the analysis of errors in the method of "sliding histogram" taken place as a result of combined non-linearity of standard test signal together with non-linearity of its movement.

引用

页码：657 / 660

页数：4

共 11 条

[1]

Abramov A.M., 2016, MONOGRAPHY

[2]

Abramov A. M., 2008, ENG INNOVATION J RYA, P17

[3]

Abramov AM, 2019, MEDD C EMBED COMPUT, P549

[4]

[Anonymous], 1987, 120286 MI

[5]

[Anonymous], 2014, METHOD VERIFICATION

[6]

[Anonymous], 1985, GOST 8009 84

[7]

[Anonymous], 2011, IEEE STANDARD 1207 2, P1, DOI [DOI 10.1109/IEEESTD.2011.5692956, 10.1109/IEEESTD.2011.5706451, DOI 10.1109/IEEESTD.2011.5706451, DOI 10.1109/IEEESTD.2011.5960751]

[8]

National Instruments Company (USA), EQ CAT RUSS CIS BALT

[9]

Proshin Ye.M., 2008, Patent, Patent No. 2337475

[10]

Sadovsky G.A., 2008, THEORETICAL FDN INFO

← 1 2 →