3C-SiC Films on Si for MEMS Applications: Mechanical Properties

被引:14
作者
Locke, C. [1 ]
Kravchenko, G. [2 ]
Waters, P. [2 ]
Reddy, J. D. [2 ]
Du, K. [2 ]
Volinsky, A. A. [2 ]
Frewin, C. L. [1 ]
Saddow, S. E. [1 ]
机构
[1] Univ S Florida, Dept Elect Engn, Tampa, FL 33620 USA
[2] Univ S Florida, Dept Mech Engn, Tampa, FL 33620 USA
来源
SILICON CARBIDE AND RELATED MATERIALS 2008 | 2009年 / 615-617卷
关键词
MEMS; 3C-SiC; Young's modulus; hardness; heteroepitaxy; CVD; SILICON-CARBIDE;
D O I
10.4028/www.scientific.net/MSF.615-617.633
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Single crystal 3C-SiC films were grown oil (100) and (111) Si substrate orientations in order to Study the resulting mechanical properties of this material. In addition, poly-crystalline 3C-SiC was also grown oil (100)Si so that a comparison with monocrystaline 3C-SiC. also grown oil (100)Si, could be made. The mechanical properties of single crystal and polycrystalline 3C-SiC films grown oil Si substrates were measured by means of namoindentation using a Berkovich diamond tip. These results indicate that polycrystalline SiC thin films are attractive for MEMS applications when compared with the single crystal 3C-SiC, which is promising since growing single crystal 3C-SiC films is more challenging. MEMS cantilevers and membranes fabricated from a 2 mu m thick single crystal 3C-SiC grown Oil (100)Si under similar conditions resulted in a small degree of bow with only 9 mu m of deflection for a cantilever of 700 mu m length with all estimated tensile Film stress of 300 MPa. Single crystal 3C-SiC films oil (111)Si substrates have the highest elastic and plastic properties, although due to high residual stress they tend to crack and delaminate.
引用
收藏
页码:633 / 636
页数:4
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