Cell-level placement for improving substrate thermal distribution

被引:137
作者
Tsai, CH [1 ]
Kang, SM [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Coordinated Sci Lab, Urbana, IL 61802 USA
关键词
physical design; reliability; thermal placement;
D O I
10.1109/43.828554
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The dramatic increase of power consumption in very large scale integration circuits has led to high operating temperature and large thermal gradient, thereby resulting in serious timing and reliability concerns. Temperature-tracking is thus becoming of paramount importance in modern electronic design automation (EDA) tools. In this paper we present two thermal placement tools for standard cell and macro cell design styles respectively. They are aimed at reducing hot spots in a design without compromising traditional design metrics such as area and wire length. We developed a compact substrate thermal model that can be used by the placer to calculate the temperature profile of a placement efficiently, or to convert the user-specified temperature constraint into the corresponding power distribution constraint as an alternative placement objective. As a result, out method is much more efficient than directly employing temperature profile simulation during the placement process. The simulation results show noticeable improvement of thermal distribution over the traditional placement algorithm, with little impact on area acid wire length of the final layout.
引用
收藏
页码:253 / 266
页数:14
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