Atomic Force Microscopy of Polymer/Layered Silicate Nanocomposites (PLSNs): A Brief Overview

被引：3

作者：

Adhikari, Rameshwar ^{[1
]}

机构：

[1] Tribhuvan Univ, Cent Dept Chem, Kathmandu, Nepal

来源：

MACROMOLECULAR SYMPOSIA | 2013年 / 327卷 / 01期

关键词：

atomic force microscopy; block copolymer; electron microscopy; nanocomposites; polymer blends; semicrystalline polymers; INTERPENETRATING NETWORK STRUCTURE; VINYLESTER/EPOXY-BASED THERMOSETS; TPO-BASED NANOCOMPOSITES; MECHANICAL CHARACTERIZATION; MALEATED POLYPROPYLENE; SURFACE DEFORMATION; PART; MORPHOLOGY; MONTMORILLONITE; ORGANOCLAY;

D O I：

10.1002/masy.201350501

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Atomic force microscopy (AFM) has been used frequently in polymer research in particular for imaging topography and phase morphology of multi-component systems. In this work, we review the application of different techniques of the AFM for the structural characterization of polymer layered silicate nanocomposites (PLSNs) with various classes of polymers (such as glassy and semicrystalline polymers, thermosetting resins etc.) as matrix. We demonstrate that AFM can be conveniently used to image not only the morphology of the composites materials with nanometer resolution but also to gain insight into their nanomechanical properties.

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页码：10 / 19

页数：10

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