THE IDENTIFICATION OF THIN DIELECTRIC OBJECTS FROM FAR FIELD OR NEAR FIELD SCATTERING DATA

被引：18

作者：

Zeev, Noam ^{[1
]}

Cakoni, Fioralba ^{[1
]}

机构：

[1] Univ Delaware, Dept Math Sci, Newark, DE 19716 USA

来源：

SIAM JOURNAL ON APPLIED MATHEMATICS | 2009年 / 69卷 / 04期

关键词：

direct and inverse scattering; scattering from cracks; linear sampling method; electromagnetic scattering; reciprocity gap functional method; thin dielectric objects; HYPERSINGULAR INTEGRAL-EQUATION; LINEAR SAMPLING METHOD; INVERSE SCATTERING; NUMERICAL-SOLUTION;

D O I：

10.1137/070711542

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

We consider the inverse scattering problem of determining the shape and the material properties of a thin dielectric infinite cylinder having an open arc as cross section from knowledge of the TM-polarized scattered electromagnetic field at a fixed frequency. We investigate two reconstruction approaches, namely the linear sampling method and the reciprocity gap functional method, using far field or near field data, respectively. Numerical examples are given showing the efficaciousness of our algorithms.

引用

页码：1024 / 1042

页数：19

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