Bragg diffraction in thin 2D refractive index modulated semiconductor samples

被引：1
作者：
He, Qiong [1 ,2 ,3 ]
Zaquine, Isabelle [1 ]
Roosen, Gerald [2 ,3 ]
Frey, Robert [1 ,2 ,3 ]
机构：
[1] CNRS, Lab Traitement & Commun Informat, Inst TELECOM Telecom ParisTech, F-75634 Paris 13, France
[2] CNRS, Inst Opt, Grad Sch, Lab Charles Fabry, F-91403 Orsay, France
[3] Univ Paris 11, Ctr Sci Paris Sud, F-91403 Orsay, France
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2009年 / 26卷 / 03期
关键词：
COUPLED-WAVE ANALYSIS; PLANAR-GRATING DIFFRACTION; BAND-EDGE; PHOTONIC CRYSTALS; QUANTUM-WELLS; IMPLEMENTATION; ENHANCEMENT; GAAS;
D O I：
10.1364/JOSAB.26.000390
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A very simple model has been developed to describe the diffractive properties of a crossed grating structure of the refractive index formed by a thin transmission grating recorded in a Bragg reflector. When the Bragg condition of the transmission grating coincides with the band edge of the reflection grating seen as a one-dimensional photonic crystal, the diffraction efficiency and wavelength selectivity of the transmission grating are highly enhanced and a Bragg diffraction regime can be obtained, even in very thin samples. The model can be used to design micrometric very efficient new diffracting devices for optical signal processing. (C) 2009 Optical Society of America
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收藏
页码：390 / 396
页数：7
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