Near-field second-harmonic generation

被引:14
|
作者
Zayats, AV [1 ]
Smolyaninov, II
机构
[1] Queens Univ Belfast, Sch Math & Phys, Belfast BT7 1NN, Antrim, North Ireland
[2] Univ Maryland, Dept Elect & Comp Engn, College Pk, MD 20742 USA
来源
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 2004年 / 362卷 / 1817期
关键词
near-field optical microscopy; second-harmonic generation; nanoscale light sources; electromagnetic field enhancement; materials imaging;
D O I
10.1098/rsta.2003.1350
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Near-field microscopy of second-harmonic generation combines high surface sensitivity of the nonlinear optical process and high spatial resolution of the near-field optics. It enables investigation of nonlinear optical phenomena at the nanoscale and provides an opportunity to develop a highly sensitive optical technique for materials characterization. fit this paper we overview apertured and apertureless near-field approaches for local studies of second-harmonic generation. Near-field second-harmonic generation at metal surfaces and nanostructures and related electromagnetic field enhancement and confinement, effects are considered. The latter demonstrates the feasibility of achieving nanoscale light sources using second-harmonic generation. Applications of second-harmonic near-field microscopy for characterization of magnetic and ferroelectric materials are also discussed. Nonlinear nano-optics can lead to the development of novel photonic devices on the sub-wavelength-scale as well as new tools for imaging and local optical studies of materials, chemical and biological species.
引用
收藏
页码:843 / 860
页数:18
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