Ideal optical contrast for 2D material observation using bi-layer antireflection absorbing substrates

被引:8
作者
Jaouen, Kevin [1 ]
Cornut, Renaud [1 ]
Ausserre, Dominique [2 ]
Campidelli, Stephane [1 ]
Derycke, Vincent [1 ]
机构
[1] Univ Paris Saclay, CEA Saclay, CEA, NIMBE,CNRS,LICSEN, F-91191 Gif Sur Yvette, France
[2] Univ Maine, UMR 6283, Inst Mol Mat Mans, Ave Olivier Messiaen, F-72000 Le Mans, France
关键词
GRAPHENE; THICKNESS; PROGRESS;
D O I
10.1039/c8nr09983a
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The capability to observe 2D materials with optical microscopy techniques is of central importance in the development of the field and is a driving force for the assembly and study of 2D material van der Waals heterostructures. Such an observation of ultrathin materials usually benefits from antireflection conditions associated with the choice of a particular substrate geometry. The most common configuration uses a transparent oxide layer with a thickness minimizing light reflection at the air/substrate interface when light travels from air to the substrate. Backside Absorbing Layer Microscopy (BALM) is a newly proposed configuration in which light travels from glass to air (or another medium such as water or a solvent) and the antireflection layer is a light-absorbing material (typically a metal). We recently showed that this technique produces images of 2D materials with unprecedented contrast and can be ideally coupled to chemical and electrochemical experiments. Here, we show that contrast can be optimal using double-layer antireflection coatings. By following in situ and with sub-nm precision the controlled deposition of molecules, we notably establish precisely the ideal observation conditions for graphene oxide monolayers which represent one of the most challenging 2D material cases in terms of transparency and thickness. We also provide guidelines for the selection of antireflection coatings applicable to a large variety of nanomaterials. This work strengthens the potential of BALM as a generic, powerful and versatile technique for the study of molecular-scale materials and phenomena.
引用
收藏
页码:6129 / 6135
页数:7
相关论文
共 35 条
[1]   Visibility of graphene flakes on a dielectric substrate [J].
Abergel, D. S. L. ;
Russell, A. ;
Fal'ko, Vladimir I. .
APPLIED PHYSICS LETTERS, 2007, 91 (06)
[2]  
Ausserre D., 2014, J NANOMED NANOTECHNO, V5
[3]   Versatile Wafer-Scale Technique for the Formation of Ultrasmooth and Thickness-Controlled Graphene Oxide Films Based on Very Large Flakes [J].
Azevedo, Joel ;
Campidelli, Stephane ;
He, Delong ;
Cornut, Renaud ;
Bertucchi, Michael ;
Sorgues, Sebastien ;
Benattar, Jean-Jacques ;
Colbeau-Justin, Christophe ;
Derycke, Vincent .
ACS APPLIED MATERIALS & INTERFACES, 2015, 7 (38) :21270-21277
[4]   Visibility of dichalcogenide nanolayers [J].
Benameur, M. M. ;
Radisavljevic, B. ;
Heron, J. S. ;
Sahoo, S. ;
Berger, H. ;
Kis, A. .
NANOTECHNOLOGY, 2011, 22 (12)
[5]   Optical contrast for identifying the thickness of two-dimensional materials [J].
Bing, Dan ;
Wang, Yingying ;
Bai, Jing ;
Du, Ruxia ;
Wu, Guoqing ;
Liu, Liyan .
OPTICS COMMUNICATIONS, 2018, 406 :128-138
[6]   Making graphene visible [J].
Blake, P. ;
Hill, E. W. ;
Castro Neto, A. H. ;
Novoselov, K. S. ;
Jiang, D. ;
Yang, R. ;
Booth, T. J. ;
Geim, A. K. .
APPLIED PHYSICS LETTERS, 2007, 91 (06)
[7]   Progress, Challenges, and Opportunities in Two-Dimensional Materials Beyond Graphene [J].
Butler, Sheneve Z. ;
Hollen, Shawna M. ;
Cao, Linyou ;
Cui, Yi ;
Gupta, Jay A. ;
Gutierrez, Humberto R. ;
Heinz, Tony F. ;
Hong, Seung Sae ;
Huang, Jiaxing ;
Ismach, Ariel F. ;
Johnston-Halperin, Ezekiel ;
Kuno, Masaru ;
Plashnitsa, Vladimir V. ;
Robinson, Richard D. ;
Ruoff, Rodney S. ;
Salahuddin, Sayeef ;
Shan, Jie ;
Shi, Li ;
Spencer, Michael G. ;
Terrones, Mauricio ;
Windl, Wolfgang ;
Goldberger, Joshua E. .
ACS NANO, 2013, 7 (04) :2898-2926
[8]   Backside absorbing layer microscopy: Watching graphene chemistry [J].
Campidelli, Stephane ;
Abou Khachfe, Refahi ;
Jaouen, Kevin ;
Monteiller, Jean ;
Amra, Claude ;
Zerrad, Myriam ;
Cornut, Renaud ;
Derycke, Vincent ;
Ausserre, Dominique .
SCIENCE ADVANCES, 2017, 3 (05)
[9]   Rayleigh imaging of graphene and graphene layers [J].
Casiraghi, C. ;
Hartschuh, A. ;
Lidorikis, E. ;
Qian, H. ;
Harutyunyan, H. ;
Gokus, T. ;
Novoselov, K. S. ;
Ferrari, A. C. .
NANO LETTERS, 2007, 7 (09) :2711-2717
[10]   Anti-reflecting and photonic nanostructures [J].
Chattopadhyay, S. ;
Huang, Y. F. ;
Jen, Y. J. ;
Ganguly, A. ;
Chen, K. H. ;
Chen, L. C. .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2010, 69 (1-3) :1-35