Probabilistic neural network-based classifier of ToF-SIMS single-pixel spectra

被引:13
作者
Tuccitto, Nunzio [1 ]
Bombace, Alessandra [1 ]
Torrisi, Alberto [1 ]
Licciardello, Antonino [1 ]
Lo Sciuto, Grazia [2 ]
Capizzi, Giacomo [2 ]
Wozniak, Marcin [3 ]
机构
[1] Univ Catania, Dept Chem Sci, Viale Andrea Doria 6, I-95125 Catania, Italy
[2] Univ Catania, Dept Elect Elect & Informat Engn, Viale Andrea Doria 6, I-95125 Catania, Italy
[3] Silesian Tech Univ, Inst Math, Kaszubska 23, PL-44100 Gliwice, Poland
关键词
Secondary ion mass spectrometry; ToF-SIMS spectra; Neural networks; Feature extraction; ToF-SIMS single-pixel spectra classification; ION MASS-SPECTROMETRY; PRINCIPAL COMPONENT ANALYSIS; MULTIVARIATE-ANALYSIS; FILMS;
D O I
10.1016/j.chemolab.2019.07.002
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A new automated procedure able to extract latent chemical information from ToF-SIMS big data sets is presented. A classifier based on a probabilistic neural network able to provide a correct classification of spectra acquired from four different polymers is designed and trained. The procedure is fast and low-demanding in terms of CPU performances, and it is also able to evaluate the similarity/dissimilarity in the Fourier transform domain of very low intensity single pixel spectra without any effort of the analyst.
引用
收藏
页码:138 / 142
页数:5
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