X-ray spectral properties of Seyfert 2s observed with BeppoSAX

We present the results of a homogeneous analysis of BeppoSAX observations of 19 bright Compton-thin Seyfert 2s. Using the wide spectral coverage of BeppoSAX it is possible to determine the single spectral components with unprecedented precision. We find that the intrinsic emission of Seyfert 2s is well reproduced by a power law with a photon index Gamma = 1.79 +/- 0.01, and a dispersion sigma = 0.23. A reflection component is present in most spectra. We discuss these results in the view of the unified model, and we show a stacked spectrum obtained adding up the 1-200 keV spectra of all the sources of the sample.