共 35 条
Image plane digital holographic microscope for the inspection of ferroelectric single crystals
被引:6
作者:

Psota, Pavel
论文数: 0 引用数: 0
h-index: 0
机构:
Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic

Mokry, Pavel
论文数: 0 引用数: 0
h-index: 0
机构:
Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic

Ledl, Vit
论文数: 0 引用数: 0
h-index: 0
机构:
Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic

Vojtisek, Petr
论文数: 0 引用数: 0
h-index: 0
机构:
Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic
机构:
[1] Acad Sci Czech Republic, Inst Plasma Phys, Reg Ctr Special Opt & Optoelect Syst TOPTEC, Slovankou 1782-3, Prague 18200 8, Czech Republic
关键词:
digital holography;
barium titanate;
domain pattern;
ferroelectric crystals;
holographic microscopy;
TOMOGRAPHY;
CELLS;
REFLECTION;
D O I:
10.1117/1.OE.55.12.121731
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
One of the most important characteristics in the research and application of ferroelectric materials is the appearance of the domain patterns, which take place in phenomena such as ferroelectric phase transitions or ferroelectric switching. The ability to visualize domains is the key factor that enables the progress in the research of these extremely interesting phenomena. However, the three-dimensional visualization of the ferroelectric domain patterns in the whole volume of the ferroelectric single crystal is not a straightforward task. We present the optical method, which allows the acquisition of quantitative and qualitative data substantial for the ferroelectric domain research. The principle of the method is based on image plane digital holographic microscopy (DHM). We used DHM setup outcomes from a Mach-Zehnder type of interferometer and phase-shifting digital holography. The studied specimen is a single crystal of barium titanate. It is demonstrated that the use of solid-state thin-film transparent electrodes of indium tin oxide greatly reduces the unwanted wavefront distortions, which are frequently produced in liquid electrodes. Using this approach, it is possible to greatly improve the DHM measurements in low applied electric fields. Thanks to the properties of the setup, real-time observation of domain walls growth or existing patterns of the ferroelectric crystal is possible. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:10
相关论文
共 35 条
[1]
Heterodyne holographic microscopy of gold particles
[J].
Atlan, Michael
;
Gross, Michel
;
Desbiolles, Pierre
;
Absil, Emilie
;
Tessier, Gilles
;
Coppey-Moisan, Maite
.
OPTICS LETTERS,
2008, 33 (05)
:500-502

Atlan, Michael
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France

Gross, Michel
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France

Desbiolles, Pierre
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France

Absil, Emilie
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Paris 06, CNRS UPR 5, Ecole Super Phys chim Ind, F-75231 Paris, France Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France

论文数: 引用数:
h-index:
机构:

Coppey-Moisan, Maite
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Paris 06, CNRS UMR 7592, Inst Jaques Monod, Dept Biol Cell, F-75231 Paris, France Univ Paris 06, CNRS UMR 8552, Lab Kastler Brossel Ecole Normale Super, F-75231 Paris, France
[2]
In situ visualization of domain kinetics in flux grown KTiOPO4 by digital holography
[J].
Canalias, C.
;
Pasiskevicius, V.
;
Laurell, F.
;
Grilli, S.
;
Ferraro, P.
;
De Natale, P.
.
JOURNAL OF APPLIED PHYSICS,
2007, 102 (06)

Canalias, C.
论文数: 0 引用数: 0
h-index: 0
机构:
Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden

论文数: 引用数:
h-index:
机构:

Laurell, F.
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden

Grilli, S.
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden

Ferraro, P.
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden

De Natale, P.
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Appl Phys, SE-10691 Stockholm, Sweden
[3]
Cell refractive index tomography by digital holographic microscopy
[J].
Charrière, F
;
Marian, A
;
Montfort, F
;
Kuehn, J
;
Colomb, T
;
Cuche, E
;
Marquet, P
;
Depeursinge, C
.
OPTICS LETTERS,
2006, 31 (02)
:178-180

Charrière, F
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Marian, A
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Montfort, F
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Kuehn, J
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Colomb, T
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Cuche, E
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Marquet, P
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Depeursinge, C
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland
[4]
Living specimen tomography by digital holographic microscopy:: morphometry of testate amoeba
[J].
Charriere, Florian
;
Pavillon, Nicolas
;
Colomb, Tristan
;
Depeursinge, Christian
;
Heger, Thierry J.
;
Mitchell, Edward A. D.
;
Marquet, Pierre
;
Rappaz, Benjamin
.
OPTICS EXPRESS,
2006, 14 (16)
:7005-7013

Charriere, Florian
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Pavillon, Nicolas
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Colomb, Tristan
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Depeursinge, Christian
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Heger, Thierry J.
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Mitchell, Edward A. D.
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Marquet, Pierre
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland

Rappaz, Benjamin
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Imaging & Appl Opt Inst, CH-1015 Lausanne, Switzerland
[5]
A digital holographic microscope for complete characterization of microelectromechanical systems
[J].
Coppola, G
;
Ferraro, P
;
Iodice, M
;
De Nicola, S
;
Finizio, A
;
Grilli, S
.
MEASUREMENT SCIENCE AND TECHNOLOGY,
2004, 15 (03)
:529-539

Coppola, G
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Microelettron & Microsistemi, I-80131 Naples, Italy

Ferraro, P
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Microelettron & Microsistemi, I-80131 Naples, Italy

Iodice, M
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Microelettron & Microsistemi, I-80131 Naples, Italy

De Nicola, S
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Microelettron & Microsistemi, I-80131 Naples, Italy

Finizio, A
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Microelettron & Microsistemi, I-80131 Naples, Italy

Grilli, S
论文数: 0 引用数: 0
h-index: 0
机构: CNR, Ist Microelettron & Microsistemi, I-80131 Naples, Italy
[6]
Digital holography for quantitative phase-contrast imaging
[J].
Cuche, E
;
Bevilacqua, F
;
Depeursinge, C
.
OPTICS LETTERS,
1999, 24 (05)
:291-293

Cuche, E
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland

Bevilacqua, F
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland

Depeursinge, C
论文数: 0 引用数: 0
h-index: 0
机构:
Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland
[7]
Holographic microscopy and diffractive microtomography of transparent samples
[J].
Debailleul, Matthieu
;
Simon, Bertrand
;
Georges, Vincent
;
Haeberle, Olivier
;
Lauer, Vincent
.
MEASUREMENT SCIENCE AND TECHNOLOGY,
2008, 19 (07)

Debailleul, Matthieu
论文数: 0 引用数: 0
h-index: 0
机构:
IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France

Simon, Bertrand
论文数: 0 引用数: 0
h-index: 0
机构:
IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France

Georges, Vincent
论文数: 0 引用数: 0
h-index: 0
机构:
IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France

Haeberle, Olivier
论文数: 0 引用数: 0
h-index: 0
机构:
IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France

Lauer, Vincent
论文数: 0 引用数: 0
h-index: 0
机构: IUT Mulhouse, Lab MIPS, F-68093 Mulhouse, France
[8]
Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of transparent thin film layers on patterned substrates
[J].
Debnath, Sanjit K.
;
Kothiyal, Mahendra P.
;
Schmit, Joanna
.
OPTICS EXPRESS,
2006, 14 (11)
:4662-4667

Debnath, Sanjit K.
论文数: 0 引用数: 0
h-index: 0
机构:
Indian Inst Technol, Dept Phys, Madras 600036, Tamil Nadu, India Indian Inst Technol, Dept Phys, Madras 600036, Tamil Nadu, India

Kothiyal, Mahendra P.
论文数: 0 引用数: 0
h-index: 0
机构: Indian Inst Technol, Dept Phys, Madras 600036, Tamil Nadu, India

Schmit, Joanna
论文数: 0 引用数: 0
h-index: 0
机构: Indian Inst Technol, Dept Phys, Madras 600036, Tamil Nadu, India
[9]
Quantitative Phase Microscopy of microstructures with extended measurement range and correction of chromatic aberrations by multiwavelength digital holography
[J].
Ferraro, P.
;
Miccio, L.
;
Grilli, S.
;
Paturzo, M.
;
De Nicola, S.
;
Finizio, A.
;
Osellame, R.
;
Laporta, P.
.
OPTICS EXPRESS,
2007, 15 (22)
:14591-14600

Ferraro, P.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

Miccio, L.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

Grilli, S.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

Paturzo, M.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

De Nicola, S.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

Finizio, A.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

Osellame, R.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy

Laporta, P.
论文数: 0 引用数: 0
h-index: 0
机构: CNR, LENS European Lab Non Linear Spectroscopy, I-80072 Arco Felice Napoli, Italy
[10]
Digital in-line holographic microscopy
[J].
Garcia-Sucerquia, J
;
Xu, WB
;
Jericho, SK
;
Klages, P
;
Jericho, MH
;
Kreuzer, HJ
.
APPLIED OPTICS,
2006, 45 (05)
:836-850

Garcia-Sucerquia, J
论文数: 0 引用数: 0
h-index: 0
机构:
Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada

Xu, WB
论文数: 0 引用数: 0
h-index: 0
机构: Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada

Jericho, SK
论文数: 0 引用数: 0
h-index: 0
机构: Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada

Klages, P
论文数: 0 引用数: 0
h-index: 0
机构: Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada

Jericho, MH
论文数: 0 引用数: 0
h-index: 0
机构: Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada

Kreuzer, HJ
论文数: 0 引用数: 0
h-index: 0
机构: Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada