Three-dimensional characterization of drug-encapsulating particles using STEM detector in FEG-SEM

被引:11
作者
Barkay, Zahava [1 ]
Rivkin, Ilia [2 ]
Margalit, Rimona [2 ]
机构
[1] Tel Aviv Univ, Wolfson Appl Mat Res Ctr, IL-69978 Tel Aviv, Israel
[2] Tel Aviv Univ, Dept Biochem, Fac Life Sci, IL-69978 Tel Aviv, Israel
关键词
Low energy STEM; SEM; Mass-thickness contrast; Drug-encapsulating particles; SCANNING-ELECTRON-MICROSCOPY; LOW-ENERGY; WET-STEM; SCATTERING; RESOLUTION;
D O I
10.1016/j.micron.2008.12.003
中图分类号
TH742 [显微镜];
学科分类号
摘要
New drug-encapsulating particles were investigated using bright field (BF) scanning transmission electron Microscopy (STEM) in a field emission gun (FEG) scanning electron microscope (SEM). Thickness characterization was done based on measuring the effective cross-section for interaction in our sample-detector configuration using calibration particles. A simplified analytical model, taking account of BF-STEM contrast and effective cross-section for interaction, was utilized for transforming projected two-dimensional BF-STEM images into three-dimensional thickness images. The three-dimensional characterization is demonstrated on a new family of biological materials composed of submicron to Micron drug-free and drug-encapsulating particles. The importance of using BF-STEM in SEM, relative to other electron microscopy methods, is discussed as well as the lateral and depth resolution. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:480 / 485
页数:6
相关论文
共 17 条
[1]   Atomic force and scanning electron microscopy of atmospheric particles [J].
Barkay, Z ;
Teller, A ;
Ganor, E ;
Levin, Z ;
Shapira, Y .
MICROSCOPY RESEARCH AND TECHNIQUE, 2005, 68 (02) :107-114
[2]   A history of scanning electron microscopy developments: Towards "wet-STEM" imaging [J].
Bogner, A. ;
Jouneau, P. -H. ;
Thollet, G. ;
Basset, D. ;
Gauthier, C. .
MICRON, 2007, 38 (04) :390-401
[3]   Wet STEM: A new development in environmental SEM for imaging nano-objects included in a liquid phase [J].
Bogner, A ;
Thollet, G ;
Basset, D ;
Jouneau, PH ;
Gauthier, C .
ULTRAMICROSCOPY, 2005, 104 (3-4) :290-301
[4]   Dopant profiling with the scanning electron microscope - A study of Si [J].
Elliott, SL ;
Broom, RF ;
Humphreys, CJ .
JOURNAL OF APPLIED PHYSICS, 2002, 91 (11) :9116-9122
[5]  
Hall C.E., 1966, Introduction to Electron Microscopy
[6]   SCATTERING PHENOMENA IN ELECTRON MICROSCOPE IMAGE FORMATION [J].
HALL, CE .
JOURNAL OF APPLIED PHYSICS, 1951, 22 (05) :655-662
[7]  
Keyse R.J., 1998, INTRO SCANNING TRANS
[8]   Low-energy STEM of multilayers and dopant profiles [J].
Merli, PG ;
Morandi, V .
MICROSCOPY AND MICROANALYSIS, 2005, 11 (01) :97-104
[9]   Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers [J].
Merli, PG ;
Morandi, V ;
Corticelli, F .
ULTRAMICROSCOPY, 2003, 94 (02) :89-98
[10]  
PEER D, 2006, Patent No. 2006050246