In-situ TEM study of the aging micromechanisms in a BaTiO3-based lead-free piezoelectric ceramic

被引：26
作者：
Fan, Zhongming [1 ]
Tan, Xiaoli [1 ]
机构：
[1] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA
来源：
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY | 2018年 / 38卷 / 10期
基金：
美国国家科学基金会;
关键词：
Aging; Fatigue; In-Situ; TEM; BZT-BCT; Domain disruption; INTERNAL BIAS; ELECTRIC FATIGUE; BEHAVIOR; FIELD; POLARIZATION; EVOLUTION;
D O I：
10.1016/j.jeurceramsoc.2018.03.049
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Aging and fatigue are the two main concerns regarding the performance reliability of piezoelectric ceramics. Compared with fatigue, less efforts have been made towards clarifying the micromechanisms of aging. In this report, we employ electric field in-situ transmission electron microscopy (TEM) to directly visualize the domain structure evolution during fatigue and the subsequent aging process in the 0.5Ba(Zr0.2Ti0.8) O-3-0.5(Ba0.7Ca0.3)TiO3 (BZT-BCT) polycrystalline ceramic. The macroscopic aging behaviors, including the development of internal bias field (E-bias) and the degradation in switchable polarization (2P(r)), are correlated with the microscopic domain wall clamping and domain disruption resulted from the redistribution of oxygen vacancies driven by depolarization field.
引用
收藏
页码：3472 / 3477
页数：6
相关论文
共 43 条
[1]   BaTiO3-based piezoelectrics: Fundamentals, current status, and perspectives [J].
Acosta, M. ;
Novak, N. ;
Rojas, V. ;
Patel, S. ;
Vaish, R. ;
Koruza, J. ;
Rossetti, G. A., Jr. ;
Roedel, J. .
APPLIED PHYSICS REVIEWS, 2017, 4 (04)
[2]  
[Anonymous], 2012, PIEZOELECTRIC CERAMI
[3]   INTERNAL BIAS IN FERROELECTRIC CERAMICS - ORIGIN AND TIME-DEPENDENCE [J].
ARLT, G ;
NEUMANN, H .
FERROELECTRICS, 1988, 87 :109-120
[4]   The Nature of Polarization Fatigue in BiFeO3 [J].
Baek, Seung-Hyub ;
Folkman, Chad M. ;
Park, Jae-Wan ;
Lee, Sanghan ;
Bark, Chung-Wung ;
Tybell, Thomas ;
Eom, Chang-Beom .
ADVANCED MATERIALS, 2011, 23 (14) :1621-+
[5]   ELECTRICAL AFTEREFFECTS IN PB(TI,ZR)O3 CERAMICS [J].
CARL, K ;
HARDTL, KH .
FERROELECTRICS, 1978, 17 (3-4) :473-486
[6]   Aging behavior and recovery of polarization in Sr0.8Bi2.4Ta2O9 thin films [J].
Chen, SY ;
Lee, VC .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (06) :3050-3055
[7]   Domain pinning behavior of ferroelectric Pb1-xSrxTiO3 ceramics [J].
Chou, CC ;
Hou, CS ;
Yeh, TH .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2005, 25 (12) :2505-2508
[8]   Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics [J].
Damjanovic, D .
REPORTS ON PROGRESS IN PHYSICS, 1998, 61 (09) :1267-1324
[9]  
Fan Z. M., 2018, ACTA MAT
[10]   Domain disruption and defect accumulation during unipolar electric fatigue in a BZT-BCT ceramic [J].
Fan, Zhongming ;
Zhou, Chao ;
Ren, Xiaobing ;
Tan, Xiaoli .
APPLIED PHYSICS LETTERS, 2017, 111 (25)
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