Mapping the Local Photoelectronic Properties of Polycrystalline Solar Cells Through High Resolution Laser-Beam-Induced Current Microscopy

被引：27

作者：

Leite, Marina S. ^{[1
,2
]}

Abashin, Maxim ^{[1
,2
]}

Lezec, Henri J. ^{[1
]}

Gianfrancesco, Anthony G. ^{[1
]}

Talin, A. Alec ^{[1
,3
,4
]}

Zhitenev, Nikolai B. ^{[1
]}

机构：

[1] NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA

[2] Univ Maryland, Maryland Nanoctr, College Pk, MD 20742 USA

[3] NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD USA

[4] Sandia Natl Labs, Livermore, CA 94550 USA

来源：

IEEE JOURNAL OF PHOTOVOLTAICS | 2014年 / 4卷 / 01期

关键词：

Cadmium compounds; current measurement; grain boundaries (GBs); photovoltaic (PV) cells; scanning probe microscopy; thin-film devices; wavelength measurement; ELECTRON; DIFFUSION; DEVICES;

D O I：

10.1109/JPHOTOV.2013.2284860

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

To boost the efficiency of thin-film polycrystalline solar cells that are microscopically inhomogeneous, it is imperative to understand how the grain interiors (GIs) and grain boundaries (GBs) within these materials affect its overall electronic properties. By using an apertured near-field scanning optical microscope in an illumination mode, we determined the local photocurrent that is generated within the GIs and at the GBs with nanoscale resolution and correlate the results with surface morphology and composition.

引用

页码：311 / 316

页数：6

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