Real-Time Amplitude and Phase Imaging of Optically Opaque Objects by Combining Full-Field Off-Axis Terahertz Digital Holography with Angular Spectrum Reconstruction

被引:25
|
作者
Yamagiwa, Masatomo [1 ,2 ]
Ogawa, Takayuki [3 ]
Minamikawa, Takeo [1 ,2 ]
Abdelsalam, Dahi Ghareab [1 ,2 ,4 ]
Okabe, Kyosuke [5 ]
Tsurumachi, Noriaki [5 ]
Mizutani, Yasuhiro [2 ,6 ]
Iwata, Testuo [1 ,2 ]
Yamamoto, Hirotsugu [2 ,7 ]
Yasui, Takeshi [1 ,2 ]
机构
[1] Tokushima Univ, Grad Sch Technol Ind & Social Sci, 2-1 Minami Josanjima, Tokushima 7708506, Japan
[2] MINOSHIMA Intelligent Opt Synthesizer Project, JST, ERATO, 2-1 Minami Josanjima, Tokushima 7708506, Japan
[3] Tokushima Univ, Grad Sch Adv Technol & Sci, 2-1 Minami Josanjima, Tokushima 7708506, Japan
[4] Natl Inst Stand, Engn & Surface Metrol Lab, Tersa St, El Haram 12211, El Giza, Egypt
[5] Kagawa Univ, Fac Engn, 2217-20 Hayashicho, Takamatsu, Kagawa 7610396, Japan
[6] Osaka Univ, Grad Sch Engn, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan
[7] Utsunomiya Univ, Ctr Opt Res & Educ, 7-1-2 Yoto, Utsunomiya, Tochigi 3218585, Japan
关键词
Terahertz; Digital holography; Phase image; Off-axis; Angular spectrum method; QUANTUM-CASCADE LASERS;
D O I
10.1007/s10762-018-0482-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Terahertz digital holography (THz-DH) has the potential to be used for non-destructive inspection of visibly opaque soft materials due to its good immunity to optical scattering and absorption. Although previous research on full-field off-axis THz-DH has usually been performed using Fresnel diffraction reconstruction, its minimum reconstruction distance occasionally prevents a sample from being placed near a THz imager to increase the signal-to-noise ratio in the hologram. In this article, we apply the angular spectrum method (ASM) for wavefront reconstruction in full-filed off-axis THz-DH because ASM is more accurate at short reconstruction distances. We demonstrate real-time phase imaging of a visibly opaque plastic sample with a phase resolution power of lambda/49 at a frame rate of 3.5 Hz in addition to real-time amplitude imaging. We also perform digital focusing of the amplitude image for the same object with a depth selectivity of 447 mu m. Furthermore, 3D imaging of visibly opaque silicon objects was achieved with a depth precision of 1.7 mu m. The demonstrated results indicate the high potential of the proposed method for in-line or in-process non-destructive inspection of soft materials.
引用
收藏
页码:561 / 572
页数:12
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