Quantitative analysis of saccharides by X-ray photoelectron spectroscopy

被引:72
|
作者
Stevens, Joanna S. [1 ]
Schroeder, Sven L. M. [1 ,2 ]
机构
[1] Univ Manchester, Sch Chem Engn & Analyt Sci, Manchester M60 1QD, Lancs, England
[2] Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England
关键词
XPS; saccharide; sugar; radiation damage; alcohol; carbohydrate; ATOMIC-FORCE MICROSCOPY; SURFACE CHARACTERIZATION; CELLULOSE; PAPER; MONOSACCHARIDE; DEGRADATION; PARTICLES; OXIDATION; XPS;
D O I
10.1002/sia.3047
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A series of saccharides, including several monohydrates and one amorphous phase, has been investigated by XPS, providing the first database of survey and high-resolution spectra for this class of compounds. Known stoichiometries and XPS-determined elemental compositions agree well. XPS has sufficient precision for distinguishing the stoichiometries of mono-, di-, and polysaccharides. The C 1s chemical shifts of the acetal and alcohol groups are similar for all samples, albeit with slight binding energy increases in the series from mono- to di- and polysaccharides. Increasing X-ray exposure causes a radiation-induced increase of the aliphatic hydrocarbon emission at 285 eV, concomitant with the appearance of a high binding energy C 1s emission peak at 289.1 eV and a decrease in the O 1s/C 1s emission intensity ratio. Formation of aliphatic hydrocarbon groups is proposed to arise from dehydroxylation, while the increase in the 289.1 eV peak can be attributed to double dehydroxylation at the C, position or partial oxidation of an alcohol or acetal group. The rate of radiation damage correlates with previously reported rates of thermally induced caramelization. Copyright (C) 2009 John Wiley & Sons, Ltd.
引用
收藏
页码:453 / 462
页数:10
相关论文
共 50 条
  • [31] Study of natural ageing of polypropylene by X-ray photoelectron spectroscopy
    Massey, S
    Roy, D
    Adnot, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 208 : 236 - 241
  • [32] The cleanability of stainless steel as determined by X-ray photoelectron spectroscopy
    Boyd, RD
    Verran, J
    Hall, KE
    Underhill, C
    Hibbert, S
    West, R
    APPLIED SURFACE SCIENCE, 2001, 172 (1-2) : 135 - 143
  • [33] XPS insights: Sample degradation in X-ray photoelectron spectroscopy
    Morgan, David J.
    SURFACE AND INTERFACE ANALYSIS, 2023, 55 (05) : 331 - 335
  • [34] Deep neural network for x-ray photoelectron spectroscopy data analysis
    Drera, G.
    Kropf, C. M.
    Sangaletti, L.
    MACHINE LEARNING-SCIENCE AND TECHNOLOGY, 2020, 1 (01):
  • [35] Analysis of laser gas nitrided titanium by X-ray photoelectron spectroscopy
    Man, HC
    Cui, ZD
    Yang, XJ
    APPLIED SURFACE SCIENCE, 2002, 199 (1-4) : 293 - 302
  • [36] Analysis of a-SiCN:H films by X-ray photoelectron spectroscopy
    Peter, S.
    Speck, F.
    Lindner, M.
    Seyller, T.
    VACUUM, 2017, 138 : 191 - 198
  • [37] Oxidation-State Analysis of Ceria by X-ray Photoelectron Spectroscopy
    Allahgholi, Aschkan
    Flege, J. Ingo
    Thiess, Sebastian
    Drube, Wolfgang
    Falta, Jens
    CHEMPHYSCHEM, 2015, 16 (05) : 1083 - 1091
  • [38] X-ray Photoelectron Spectroscopy Analysis of Wood Degradation in Old Architecture
    Sun, He
    Yang, Yan
    Han, Yanxia
    Tian, Mingjin
    Li, Bin
    Han, Li
    Wang, Aifeng
    Wang, Wei
    Zhao, Rui
    He, Yiming
    BIORESOURCES, 2020, 15 (03): : 6332 - 6343
  • [39] Analysis of the Broadening of X-ray Photoelectron Spectroscopy Peaks for Ionic Crystals
    Nelin, Connie J.
    Bagus, Paul S.
    Brown, Matthew A.
    Sterrer, Martin
    Freund, Hans-Joachim
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2011, 50 (43) : 10174 - 10177
  • [40] X-ray photoelectron spectroscopy analysis of TiBx (1.3≤x≤3.0) thin films
    Hellgren, Niklas
    Greczynski, Grzegorz
    Sortica, Mauricio A.
    Petrov, Ivan
    Hultman, Lars
    Rosen, Johanna
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2021, 39 (02):