Measuring the Topological Phase Through the Interface States Between Metasurfaces and Photonic Crystals

被引：0

作者：

Wang, Qiang ^{[1
]}

Xiao, Meng ^{[2
,3
]}

Liu, Hui ^{[1
]}

Zhu, Shining ^{[1
]}

Chan, C. T. ^{[2
,3
]}

机构：

[1] Nanjing Univ, Natl Ctr Microstruct & Quantum Manipulat, Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China

[2] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Hong Kong, Peoples R China

[3] Hong Kong Univ Sci & Technol, Inst Adv Study, Kowloon, Hong Kong, Peoples R China

来源：

2016 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2016年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We propose a scheme and experimentally measure the topological phase in a photonic system. Using reflection spectrum measurement, we determined the existence of interface states in the gaps, and then obtained the topological phases.

引用

页数：2

共 7 条

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