Protein monolayers monitored by internal reflection ellipsometry

被引:94
|
作者
Poksinski, M [1 ]
Arwin, H [1 ]
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, Lab Appl Opt, SE-58183 Linkoping, Sweden
关键词
ellipsometry; total internal reflection; protein adsorption; surface plasmon resonance; ferritin;
D O I
10.1016/j.tsf.2004.01.037
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Total internal reflection ellipsometry (TIRE) in spectroscopic mode in the wavelength range 400-1200 nm is employed in situ at a solid/liquid interface for investigation of protein adsorption on thin semitransparent gold films. In this configuration, the surface plasmon resonance phenomenon gives a large enhancement of the thin film sensitivity. Adsorption of a monolayer of the protein ferritin is monitored kinetically in situ and results in a change in the ellipsometric parameter A of more than 90degrees compared to 3degrees in similar ellipsometric measurements on gold substrates. This large sensitivity demonstrates a potential for sensor applications. The ferritin layer optical function is modeled with a Cauchy dispersion model resulting in a layer thickness of 9.2 nm, in good agreement with the dimension of the ferritin molecules. A transition layer between the protein film and the gold layer is necessary to introduce in the model to account for interactions between the protein layer and the gold film. The large sensitivity of TIRE for thin layers opens up a pathway to analyze in detail the structure of thin protein layers provided that a further development of the experimental setup and the model for the protein layer is carried out. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:716 / 721
页数:6
相关论文
共 50 条
  • [41] Direct observation of amyloid growth monitored by total internal reflection fluorescence microscopy
    Ban, Tadato
    Goto, Yuji
    AMYLOID, PRIONS, AND OTHER PROTEIN AGGREGATES, PT C, 2006, 413 : 91 - 102
  • [42] Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry
    Karlsson, LM
    Schubert, M
    Ashkenov, N
    Arwin, H
    THIN SOLID FILMS, 2004, 455 : 726 - 730
  • [43] Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry
    Kalas, B.
    Nador, J.
    Agocs, E.
    Saftics, A.
    Kurunczi, S.
    Fried, M.
    Petrik, P.
    APPLIED SURFACE SCIENCE, 2017, 421 : 585 - 592
  • [44] The study of genomic DNA adsorption and subsequent interactions using total internal reflection ellipsometry
    Nabok, Alexei
    Tsargorodskaya, Anna
    Davis, Frank
    Higson, Seamus P. J.
    BIOSENSORS & BIOELECTRONICS, 2007, 23 (03): : 377 - 383
  • [45] Plasmon resonance-enhanced internal reflection ellipsometry for the trace detection of mercuric ion
    M. O. Caglayan
    International Journal of Environmental Science and Technology, 2018, 15 : 909 - 914
  • [46] Detection of ion adsorption at solid-liquid interfaces using internal reflection ellipsometry
    Wang, Lei
    Zhao, Cunlu
    Duits, Michel H. G.
    Mugele, Frieder
    Siretanu, Igor
    SENSORS AND ACTUATORS B-CHEMICAL, 2015, 210 : 649 - 655
  • [47] In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry
    Poksinski, M
    Arwin, H
    SENSORS AND ACTUATORS B-CHEMICAL, 2003, 94 (03) : 247 - 252
  • [48] Total internal reflection ellipsometry and SPR detection of low molecular weight environmental toxins
    Nabok, AV
    Tsargorodskaya, A
    Hassan, AK
    Starodub, NF
    APPLIED SURFACE SCIENCE, 2005, 246 (04) : 381 - 386
  • [49] Study of the Interaction Between Biomolecule Mono layers Using Total Internal Reflection Ellipsometry
    Jung, Yong Woo
    Yoon, Jae Jin
    Kim, Young Dong
    Woo, Deokha
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2011, 58 (04) : 1031 - 1034
  • [50] Accurate Permittivity Extraction of Hyperbolic Metamaterials using Attenuated Total Internal Reflection Ellipsometry
    Zhang, Cheng
    Hong, Nina
    Ji, Chengang
    Zhu, Wenqi
    Agrawal, Amit
    Guo, L. Jay
    Lezec, Henri
    Tiwald, Tom T.
    Schoeche, Stefan
    Hilfiker, James N.
    2017 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2017,