Analog Stimulus Generator for ADC Testing in Mixed-signal SOC

被引：0

作者：

Yin Shirong ^{[1
]}

机构：

[1] Chongqing Jiaotong Univ, Chongqing 400074, Peoples R China

来源：

2012 INTERNATIONAL CONFERENCE ON APPLIED INFORMATICS AND COMMUNICATION (ICAIC 2012) | 2013年

关键词：

Stimulus generator; ADC test; Mixed-signal;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

This paper researched analog stimulus generator for ADC testing in mixed-signal SOC. A Sigma-Delta modulation based sinusoidal signal generator to characterize the dynamic parameters of ADC under test. A current source charging based ramp signal generator to characterize the static parameters of ADC. Those two generators were performed on the chip.

引用

页码：256 / 260

页数：5

共 7 条

[1]

Barragan Manuel J., 2006, DESIGN DIAGNOSTICS E, P117

[2]

Bernard S., P 2001 IEEE INT S DE, P1

[3]

Dallet Dominique, 2007, DYNAMIC CHARACTERISA

[4]

Kim Seokjin, 2009, IEEE T INSTRUMENTATI, V58

[5]

Lee Kuen-Jong, P 12 AS TEST S ATS 0, P1

[6]

Santosh C, 2009, IEEE T POWER DELIVER, V24

[7] A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a sigma-delta ADC [J].

Toner, MF ;

Roberts, GW .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1996, 43 (08) :608-613

← 1 →