Electric-field effects on the diffusion of Si and Ge adatoms on Si(001) studied by density functional simulations

被引:3
作者
He, Yao [1 ]
Che, J. G. [2 ]
机构
[1] Yunnan Univ, Dept Phys, Kunming 650091, Peoples R China
[2] Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 23期
基金
中国国家自然科学基金;
关键词
SCANNING-TUNNELING-MICROSCOPY; TOTAL-ENERGY CALCULATIONS; WAVE BASIS-SET; SI(100) SURFACE; AB-INITIO; BINDING; ROTATION; DIMERS;
D O I
10.1103/PhysRevB.79.235430
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present results of density functional theory (DFT) calculations of the electric-field effects on the clean Si(001) surface and the diffusion of Si or Ge adatoms on Si(001) surface. Our results indicate that the electric field only slightly affected the dimer bond lengths and buckling angles of the clean Si(001), implying that the electric field of scanning tunneling microscopy tip should not be responsible for the observation of symmetric dimers and the flip-flop motion of the buckling dimers. Also, the electric field mainly influences the diffusion along the dimer row, and the diffusion barrier could be reduced greatly under a positive electric field. It can be expected that the positive field should make the diffusion of Si or Ge adatoms on the Si(001) surface become more anisotropic.
引用
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页数:5
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共 28 条
[1]   PREDICTION OF THE EFFECT OF THE SAMPLE BIASING IN SCANNING TUNNELING MICROSCOPY AND OF SURFACE-DEFECTS ON THE OBSERVED CHARACTER OF THE DIMERS IN THE SI(001)-(2X1) SURFACE [J].
BADZIAG, P ;
VERWOERD, WS ;
VANHOVE, MA .
PHYSICAL REVIEW B, 1991, 43 (03) :2058-2062
[2]   BINDING AND DIFFUSION OF A SI ADATOM ON THE SI(100) SURFACE [J].
BROCKS, G ;
KELLY, PJ ;
CAR, R .
PHYSICAL REVIEW LETTERS, 1991, 66 (13) :1729-1732
[3]   Direct measurement of field effects on surface diffusion [J].
Carpinelli, JM ;
Swartzentruber, BS .
PHYSICAL REVIEW B, 1998, 58 (20) :13423-13425
[4]   Change of ground state configuration induced by the Stark shift of surface states in some bcc(001) surfaces [J].
Che, JG ;
Zhu, ZZ ;
Chan, CT .
PHYSICAL REVIEW LETTERS, 1999, 82 (16) :3292-3295
[5]   Charge transfer, surface charging, and overlayer-induced faceting [J].
Che, JG ;
Chan, CT .
PHYSICAL REVIEW B, 2003, 67 (12)
[6]   Adsorption of monomers on semiconductors and the importance of surface degrees of freedom [J].
Dalpian, GM ;
Fazzio, A ;
da Silva, AJR .
PHYSICAL REVIEW B, 2001, 63 (20)
[7]   A SCANNING TUNNELING MICROSCOPY STUDY OF THE REACTION OF SI(001)-(2X1) WITH NH3 [J].
HAMERS, RJ ;
AVOURIS, P ;
BOZSO, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :508-511
[8]   SCANNING TUNNELING MICROSCOPY OF SI(001) [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357
[9]   Effect of external electric field on the surface energetics of Ag/Si(111) [J].
He, Y ;
Wei, XY ;
Chan, CT ;
Che, JG .
PHYSICAL REVIEW B, 2005, 71 (04)
[10]   Strain effect on adatom binding and diffusion in homo- and heteroepitaxies of Si and Ge on (001) Surfaces [J].
Huang, L ;
Liu, F ;
Gong, XG .
PHYSICAL REVIEW B, 2004, 70 (15) :155320-1