In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction

被引：4

作者：

Castellote, M ^{[1
]}

Turrillas, X

Andrade, C

Alonso, C

Rodriguez, MA

Kvick, Å

机构：

[1] CSIC, Inst Construct Sci Eduardo Torroja, Madrid, Spain

[2] CSIC, Inst Ceram & Glass, Madrid, Spain

[3] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2004年 / 79卷 / 03期

关键词：

D O I：

10.1007/s00339-003-2076-x

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An external dc voltage was applied to a cured cement paste to simulate its natural degradation as a function of time. The electrical treatment was monitored in situ by simultaneous acquisition of diffraction patterns every 10 min. The analysis of the diffraction patterns has confirmed that the microstructure of the whole paste changes during the treatment, with precipitation and dissolution of several phases. This work contributes to the understanding of the fundamentals of the microstructure alterations that take place upon application of an electrical field, allowing the establishment of a first approach to the understanding of the mechanism of these changes.

引用

页码：661 / 669

页数：9