Pulse plated cadmium telluride films and their characteristics

Cadmium telluride thin films were deposited on conducting glass and titanium substrates by the pulse plating technique at different duty cycles in the range 10-50%. The films were characterised by X-ray diffraction and were found to possess single phase cubic structure. Optical studies indicated a direct band gap of 1.45 eV. Surface morphology of the films indicated that the crystallite size increases with increase of duty cycle. X-ray photoelectron spectroscopy studies confirmed the formation of CdTe. Electron-dispersive X-ray studies were made to estimate the composition. Cross-plane resistivity measurements indicated that the resistivity decreases with increase of duty cycle.