Surface modifications on Teflon FEP and Mylar C induced by a low energy electron beam: a Raman and FTIR spectroscopic study

被引：4
|
作者：
Chinaglia, DL [1 ]
Constantino, CJL
Aroca, RF
Oliveira, ON
机构：
[1] UNESP, Dept Fis, Rio Claro, SP, Brazil
[2] Univ Windsor, Sch Phys Sci, Mat & Surface Sci Grp, Windsor, ON N9B 3P4, Canada
[3] USP, Inst Fis Sao Carlos, Sao Carlos, SP, Brazil
来源：
MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2002年 / 374卷
关键词：
electron beam irradiation; Raman spectroscopy;
D O I：
10.1080/10587250210474
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The surface modifications induced on Teflon FEP and Mylar C polymer films by a low energy electron beam are probed using Raman and FTIR spectroscopy. The electron beam, which does not affect the Mylar C, surface, may break the copolymer chain into its monomers degrading the Teflon FEP surface. For Mylar C the electron beam decreases the roughness of the polymer surface. This difference in behavior may explain recent results in which the surface modifications investigated by measuring the second crossover energy shift in the electronic emission curve differed for the two polymers (Chinaglia et al [1]). In addition, the Raman data showed no evidence of carbon formation for either polymer samples, which is explained by the fact that only a low energy electron beam is used.
引用
收藏
页码：577 / 582
页数：6
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