Surface modifications on Teflon FEP and Mylar C induced by a low energy electron beam: a Raman and FTIR spectroscopic study

被引：4
|
作者：
Chinaglia, DL [1 ]
Constantino, CJL
Aroca, RF
Oliveira, ON
机构：
[1] UNESP, Dept Fis, Rio Claro, SP, Brazil
[2] Univ Windsor, Sch Phys Sci, Mat & Surface Sci Grp, Windsor, ON N9B 3P4, Canada
[3] USP, Inst Fis Sao Carlos, Sao Carlos, SP, Brazil
来源：
MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2002年 / 374卷
关键词：
electron beam irradiation; Raman spectroscopy;
D O I：
10.1080/10587250210474
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The surface modifications induced on Teflon FEP and Mylar C polymer films by a low energy electron beam are probed using Raman and FTIR spectroscopy. The electron beam, which does not affect the Mylar C, surface, may break the copolymer chain into its monomers degrading the Teflon FEP surface. For Mylar C the electron beam decreases the roughness of the polymer surface. This difference in behavior may explain recent results in which the surface modifications investigated by measuring the second crossover energy shift in the electronic emission curve differed for the two polymers (Chinaglia et al [1]). In addition, the Raman data showed no evidence of carbon formation for either polymer samples, which is explained by the fact that only a low energy electron beam is used.
引用
收藏
页码：577 / 582
页数：6
相关论文
共 27 条
  • [1] Electron-beam-induced annealing of natural zircon: a Raman spectroscopic study
    Tamás Váczi
    Lutz Nasdala
    Physics and Chemistry of Minerals, 2017, 44 : 389 - 401
  • [2] Electron-beam-induced annealing of natural zircon: a Raman spectroscopic study
    Vaczi, Tamas
    Nasdala, Lutz
    PHYSICS AND CHEMISTRY OF MINERALS, 2017, 44 (06) : 389 - 401
  • [3] Low-Energy Electron Beam Induced Charging and Secondary Electron Emission Properties of FEP Film Used on Satellite Surfaces
    Fujii, Haruhisa
    Okumura, Teppei
    Takahashi, Masato
    ELECTRICAL ENGINEERING IN JAPAN, 2014, 188 (01) : 9 - 17
  • [4] X-RAY PHOTOEMISSION AND RAMAN-SCATTERING SPECTROSCOPIC STUDY OF SURFACE MODIFICATIONS OF SILICON INDUCED BY ELECTRON-CYCLOTRON RESONANCE ETCHING
    YAPSIR, AS
    OEHRLEIN, GS
    FORTUNOWILTSHIRE, G
    TSANG, JC
    APPLIED PHYSICS LETTERS, 1990, 57 (06) : 590 - 592
  • [5] Mechanism of surface modifications on a NiTi alloy treated with low energy high current pulsed electron beam
    Zou, J. X.
    Grosdidier, T.
    Zhang, K. M.
    Dong, C.
    Weber, S.
    EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2008, 43 (03): : 327 - 331
  • [6] Surface modification study of low energy electron beam irradiated polycarbonate film
    Nathawat, Rashi
    Kumar, Anil
    Kulshrestha, Vaibhav
    Singh, M.
    Ganesan, V.
    Phase, D. M.
    Vijay, Y. K.
    APPLIED SURFACE SCIENCE, 2007, 253 (14) : 5985 - 5991
  • [7] Modifications in the melted surface layer under low energy high current pulsed electron beam (LEHCPEB) treatment
    Grosdidier, T.
    Zou, J. X.
    Hao, S. Z.
    Dong, C.
    TRANSACTIONS OF THE INDIAN INSTITUTE OF METALS, 2009, 62 (4-5) : 479 - 483
  • [8] Modifications in the melted surface layer under low energy high current pulsed electron beam (LEHCPEB) treatment
    T. Grosdidier
    J.X. Zou
    S.Z. Hao
    C. Dong
    Transactions of the Indian Institute of Metals, 2009, 62 : 479 - 483
  • [9] Long distance electron transfer in cytochrome c oxidase immobilised on electrodes. A surface enhanced resonance Raman spectroscopic study
    Hrabakova, J
    Ataka, K
    Heberle, J
    Hildebrandt, P
    Murgida, DH
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2006, 8 (06) : 759 - 766
  • [10] Study of adhesion characteristic of a surface alloy formed by a low-energy high-current electron beam
    Yakovlev, E. V.
    Markov, A. B.
    Shepel, D. A.
    Petrov, V. I.
    14TH INTERNATIONAL CONFERENCE GAS DISCHARGE PLASMAS AND THEIR APPLICATIONS, 2019, 1393
123