Stoichiometry and structural refinement of liquid-phase epitaxial grown LiNb1-xTaxO3 films on LiNbO3 substrates

被引：3
作者：
Kaigawa, K
Yamamura, Y
Kumazawa, Y
Kawaguchi, T
Imaeda, M
Sakai, H
Tsurumi, T
机构：
[1] NGK Insulators Ltd, Mizuho Ku, Nagoya, Aichi 4678530, Japan
[2] Tokyo Inst Technol, Grad Sch Sci & Engn, Dept Met & Ceram Sci, Meguro Ku, Tokyo 1528552, Japan
来源：
JOURNAL OF CRYSTAL GROWTH | 2002年 / 244卷 / 01期
关键词：
high resolution X-ray diffraction; interface; liquid phase epitaxy; lithium compounds; niobates; nonlinear optic materials;
D O I：
10.1016/S0022-0248(02)01609-3
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The quantitative analysis of Li content in the liquid-phase epitaxial (LPE) grown LiNb1-xTaxO3 (LNT) film by combining high-resolution X-ray diffractometry (HR-XRD) and electron probe microanalysis (EPMA) is proposed. The X-ray rocking curves of the LNT films grown on LiNbO3 (LN) substrates are simulated, and then the interface sharpness is analyzed. The combination of HR-XRD and EPMA reveals that the Li content in the LNT films increases with decreasing growth temperature. The simulation of rocking curves suggests that the LNT/LN films do not have the thick fluctuation layer in Li content, but they have Nb/Ta interdiffusion layers at the interfaces. The activation energy can be estimated from an Arrhenius plot of the calculated diffusion coefficients. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：78 / 87
页数：10
相关论文
共 33 条
1234