Nanoscale surface electrical properties of aluminum zinc oxide thin films investigated by scanning probe microscopy (vol 104, 114314, 2008)

被引：0

作者：

Chen, Sy-Hann ^{[1
,2
]}

Yu, Chang-Feng ^{[1
,2
]}

Lin, Yung-Shao ^{[1
,2
]}

Xie, Wen-Jia ^{[1
,2
]}

Hsu, Ting-Wei ^{[1
,2
]}

Tsai, Din Ping ^{[3
]}

机构：

[1] Natl Chiayi Univ, Dept Appl Phys, Chiayi 600, Taiwan

[2] Natl Chiayi Univ, Inst Optoelect & Solid State Elect, Chiayi 600, Taiwan

[3] Natl Taiwan Univ, Dept Phys, Taipei 106, Taiwan

来源：

关键词：

aluminium compounds; II-VI semiconductors; pulsed laser deposition; scanning probe microscopy; wide band gap semiconductors;

D O I：

10.1063/1.3177343

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页数：1