Surface speciation of calcite observed in situ by high-resolution X-ray reflectivity

被引:236
|
作者
Fenter, P [1 ]
Geissbühler, P
DiMasi, E
Srajer, G
Sorensen, LB
Sturchio, NC
机构
[1] Argonne Natl Lab, Div Environm Res, Argonne, IL 60439 USA
[2] Univ Washington, Dept Phys, Seattle, WA 98195 USA
[3] Brookhaven Natl Lab, Div Phys, Upton, NY 11973 USA
[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
关键词
D O I
10.1016/S0016-7037(99)00403-2
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
High-resolution, in situ X-ray reflectivity measurements were made of the calcite (104)-water interface in calcite-saturated aqueous solutions at pH values ranging from 6.8 to 12.1 and low P-CO2. The X-ray reflectivity data, taken over a momentum transfer range of 6 Angstrom(-1), indicate that the calcite surface does not vary significantly over this range of experimental conditions. From an analysis of the data at pH 8.3, the best-fit reflectivity model requires the presence of 1.0 +/- 0.4 monolayer of a hydroxyl species (OH or OH2) at 2.50 +/- 0.12 Angstrom above the surface Ca ions and involves rotations of the surface carbonate groups toward the (104) plane. The X-ray reflectivity data for pH 6.8 and 12.1 can be explained without invoking changes other than protonation reactions in the surface speciation of terrace areas. This is consistent with scanning force microscopy studies of calcite growth and dissolution near equilibrium, which show that attachment and detachment of Ca and CO3 ions occurs primarily at step-edge kink sites. These results demonstrate how high-resolution X-ray reflectivity can be used for direct, in situ measurement of mineral surface structure, to provide strong constraints on chemical speciation and reactivity at the mineral-fluid interface. Copyright (C) 2000 Elsevier Science Ltd.
引用
收藏
页码:1221 / 1228
页数:8
相关论文
共 50 条
  • [21] IN-SITU SYNCHROTRON X-RAY REFLECTIVITY MEASUREMENTS AT THE CALCITE-WATER INTERFACE
    CHIARELLO, RP
    WOGELIUS, RA
    STURCHIO, NC
    GEOCHIMICA ET COSMOCHIMICA ACTA, 1993, 57 (16) : 4103 - 4110
  • [22] High-resolution x-ray monochromators
    Ishikawa, T
    Tamasaku, K
    Yabashi, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 547 (01) : 42 - 49
  • [23] High-resolution x-ray diffraction and x-ray reflectivity studies of short-period CdTe/MnTe-superlattices
    Stangl, J
    Darhuber, AA
    Holy, V
    de Naurois, M
    Ferreira, S
    Faschinger, W
    Bauer, G
    JOURNAL OF CRYSTAL GROWTH, 1998, 184 : 105 - 108
  • [24] MODERATE RESOLUTION X-RAY REFLECTIVITY
    SHINDLER, JD
    SUTER, RM
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (11) : 5343 - 5347
  • [25] Thermal expansion of low dielectric constant thin films by high-resolution x-ray reflectivity
    Omote, K
    Ito, Y
    Thin Films Stresses and Mechanical Properties XI, 2005, 875 : 223 - 228
  • [26] Direct and quantitative comparison of pixelated density profiles with high-resolution X-ray reflectivity data
    Fenter, P.
    Lee, S. S.
    Skelton, A. A.
    Cummings, P. T.
    JOURNAL OF SYNCHROTRON RADIATION, 2011, 18 : 257 - 265
  • [27] Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction
    Chamard, V
    Pichat, C
    Dolino, G
    EUROPEAN PHYSICAL JOURNAL B, 2001, 21 (02) : 185 - 190
  • [28] Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction
    V. Chamard
    C. Pichat
    G. Dolino
    The European Physical Journal B - Condensed Matter and Complex Systems, 2001, 21 : 185 - 190
  • [29] Integrated reflectivity measurements of hydrogen phthalate crystals for high-resolution soft x-ray spectroscopy
    Zastrau, U.
    Foerster, E.
    JOURNAL OF INSTRUMENTATION, 2014, 9
  • [30] High-resolution X-ray holograph on the deck
    Bradley, David
    MATERIALS TODAY, 2014, 17 (03) : 105 - 106