Test Configuration for Incipient Fault Detection

被引:0
作者
Yang, Shuming [1 ]
Wen, Xiaoyu [1 ]
Zhang, Xiaofei [1 ]
机构
[1] Natl Univ Def Technol, Coll Basic Educ, Changsha 410073, Hunan, Peoples R China
来源
PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON ELECTRONICS, NETWORK AND COMPUTER ENGINEERING (ICENCE 2016) | 2016年 / 67卷
基金
美国国家科学基金会;
关键词
Equipment Health Management; Design for Testability; Test Optimization Configuration; Generic Algorithm;
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Information sensing and test are premise and foundation of (Equipment Health Management, EHM), a reasonable sensor configuration not only provide accurate and complete fault information, but also improve fault diagnostics, fault prognostics and health state evaluation capability. To address the problem that the traditional test selection and optimization are mainly for fault detection and isolation, then, testability indices for EHM are firstly formulated quantitatively, then, test optimization selection model which minimizes test cost is modeled, and the generic algorithm is introduced to solve the problem. At last, a simulation case and an application case are given to verify & validate the proposed model and method.
引用
收藏
页码:450 / 454
页数:5
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