Influence of sintering temperature on core-shell structure evolution and reliability in Dy modified BaTiO3 dielectric ceramics

被引:18
作者
Gong, Huiling [1 ]
Wang, Xiaohui [1 ]
Zhang, Shaopeng [1 ]
Yang, Xinye [1 ]
Li, Longtu [1 ]
机构
[1] Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2014年 / 211卷 / 05期
基金
中国国家自然科学基金;
关键词
core-shell structure; impedance spectroscopy; modified BaTiO3 ceramics; reliability; DC-ELECTRICAL DEGRADATION; PEROVSKITE-TYPE TITANATES; RESISTANCE DEGRADATION; BARIUM-TITANATE; CAPACITORS; MICROSTRUCTURE; ELECTRODE; MECHANISM;
D O I
10.1002/pssa.201400013
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The formation of core-shell structure plays a very important role in temperature stable BaTiO3-based dielectric ceramic for multilayer ceramic capacitors applications. In this work, the rare earth Dy modified BaTiO3 dielectric ceramics have been prepared by chemical coating method, which possess high dielectric constant and high insulation resistivity, satisfying the EIA X7R specification. The existence of core-shell structure was proven by transmission electron microscopy observation and energy dispersive spectroscopy analysis. Experimental results show that the sintering temperature has a strong effect on the core-shell structure evolution in Dy-doped BaTiO3 ceramics. Thus, selecting an appropriate sintering temperature is conducive for improving the temperature stability for multilayer ceramic capacitors applications. Furthermore, impedance analysis and the highly accelerated lifetime test show that the core-shell structure evolution has a closely relationship with the reliability accompanied by the increasing of sintering temperatures.
引用
收藏
页码:1213 / 1218
页数:6
相关论文
共 31 条
[1]   DC ELECTRICAL DEGRADATION OF PEROVSKITE-TYPE TITANATES .3. A MODEL OF THE MECHANISM [J].
BAIATU, T ;
WASER, R ;
HARDTL, KH .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1990, 73 (06) :1663-1673
[2]   Dc-electrical degradation of the BT-based material for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and microstructure [J].
Chazono, H ;
Kishi, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (9B) :5624-5629
[3]   Mixed conduction and chemical diffusion in a Pb(Zr0.53,Ti0.47)O3 buried capacitor structure [J].
Donnelly, Niall J. ;
Randall, Clive A. .
APPLIED PHYSICS LETTERS, 2010, 96 (05)
[4]   Ab initio calculations of BaTiO3 (111) surfaces [J].
Eglitis, R. I. .
PHASE TRANSITIONS, 2013, 86 (11) :1115-1120
[5]   Ab initio calculations of BaTiO3 and PbTiO3 (001) and (011) surface structures [J].
Eglitis, R. I. ;
Vanderbilt, David .
PHYSICAL REVIEW B, 2007, 76 (15)
[6]  
Frasco E., 2001, ISTFA 2001 P 27 INT
[7]  
HENNINGS D, 1984, J AM CERAM SOC, V67, P249, DOI 10.1111/j.1151-2916.1984.tb18841.x
[8]   Kinetics of Oxygen Diffusion into Multilayer Ceramic Capacitors During the Re-oxidation Process and its Implications on Dielectric Properties [J].
Kaneda, Kazumi ;
Lee, Soonil ;
Donnelly, Niall J. ;
Qu, Weiguo ;
Randall, Clive A. ;
Mizuno, Youichi .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2011, 94 (11) :3934-3940
[9]   Degradation behaviors and failure analysis of Ni-BaTiO3 base-metal electrode multilayer ceramic capacitors under highly accelerated life test [J].
Kim, Jungwoo ;
Yoon, Dongcheol ;
Jeon, Minseok ;
Kang, Dowon ;
Kim, Jeongwook ;
Lee, Heesoo .
CURRENT APPLIED PHYSICS, 2010, 10 (05) :1297-1301
[10]  
Kishi H, 2003, JPN J APPL PHYS 1, V42, P1, DOI 10.1143/JJAP.42.11