An atom trap trace analysis system for measuring krypton contamination in xenon dark matter detectors

被引：14

作者：

Aprile, E. ^{[1
]}

Yoon, T. ^{[1
]}

Loose, A. ^{[1
]}

Goetzke, L. W. ^{[1
]}

Zelevinsky, T. ^{[1
]}

机构：

[1] Columbia Univ, Dept Phys, New York, NY 10027 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2013年 / 84卷 / 09期

基金：

美国国家科学基金会;

关键词：

MAGNETOOPTICAL TRAP; DISCHARGE;

D O I：

10.1063/1.4821879

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have developed an atom trap trace analysis (ATTA) system to measure Kr in Xe at the part per trillion (ppt) level, a prerequisite for the sensitivity achievable with liquid xenon dark matter detectors beyond the current generation. Since Ar and Kr have similar laser cooling wavelengths, the apparatus has been tested with Ar to avoid contamination prior to measuring Xe samples. A radio-frequency plasma discharge generates a beam of metastable atoms which is optically collimated, slowed, and trapped using standard magneto-optical techniques. Based on the measured overall system efficiency of 1.2 x 10(-8) (detection mode), we expect the ATTA system to reach the design goal sensitivity to ppt concentrations of Kr in Xe in <2 h. (C) 2013 AIP Publishing LLC.

引用

页数：6

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