Plasma-nitrided high-k polycrystalline nano-array induced by electron irradiation

被引:4
作者
Huang, A. P.
Wang, L.
Xu, J. B.
Chu, Paul K.
机构
[1] City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
[2] Chinese Univ Hong Kong, Dept Elect Engn, Solid State Lab, Shatin, Hong Kong, Peoples R China
关键词
D O I
10.1088/0957-4484/17/17/015
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The microstructure of plasma-nitrided high-k ZrO2 thin films is found to continuously transform and larger size nano-crystals are formed during electron bombardment. Real-time high-resolution transmission electron microscopy (HRTEM) studies show that the plasma-nitrided nano-size particles can self-crystallize and regrow, whereas this phenomenon is not observed in amorphous ZrO2 without N incorporation. Similar results are observed in plasma-nitrided HfO2 samples and fine-scale polycrystalline nano-arrays are obtained by electron irradiation. Our results show that incorporation of N is crucial for inducing microstructural evolution as well as polycrystalline nano-array formation in high-k oxide under electron irradiation.
引用
收藏
页码:4379 / 4383
页数:5
相关论文
共 13 条
[1]   Solution-based fabrication of high-k gate dielectrics for next-generation metal-oxide semiconductor transistors [J].
Aoki, Y ;
Kunitake, T .
ADVANCED MATERIALS, 2004, 16 (02) :118-+
[2]   In situ transmission electron microscopy study of irradiation induced dewetting of ultrathin Pt films [J].
Hu, XY ;
Cahill, DG ;
Averback, RS ;
Birtcher, RC .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (01) :165-169
[3]   Ion-beam-induced amorphization and order-disorder transition in the murataite structure [J].
Lian, J ;
Wang, LM ;
Ewing, RC ;
Yudintsev, SV ;
Stefanovsky, SV .
JOURNAL OF APPLIED PHYSICS, 2005, 97 (11)
[4]   Crystallization behaviour of ALD-Ta2O5 thin films:: the application of in-situ TEM [J].
Min, KH ;
Sinclair, R ;
Park, IS ;
Kim, ST ;
Chung, UI .
PHILOSOPHICAL MAGAZINE, 2005, 85 (18) :2049-2063
[5]   Effects of nitrogen atom doping on dielectric constants of Hf-based gate oxides [J].
Momida, H ;
Hamada, T ;
Yamamoto, T ;
Uda, T ;
Umezawa, N ;
Chikyow, T ;
Shiraishi, K ;
Ohno, T .
APPLIED PHYSICS LETTERS, 2006, 88 (11)
[6]   TITANIUM NITRIDE OXIDATION CHEMISTRY - AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY [J].
SAHA, NC ;
TOMPKINS, HG .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (07) :3072-3079
[7]   Stability and band offsets of nitrogenated high-dielectric-constant gate oxides [J].
Shang, G ;
Peacock, PW ;
Robertson, J .
APPLIED PHYSICS LETTERS, 2004, 84 (01) :106-108
[8]   HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF SILICON REGROWTH AT CONTROLLED ELEVATED-TEMPERATURES [J].
SINCLAIR, R ;
PARKER, MA .
NATURE, 1986, 322 (6079) :531-533
[9]   RADIATION-DAMAGE AND STRUCTURAL STUDIES - HALOGENATED PHTHALOCYANINES [J].
SMITH, DJ ;
FRYER, JR ;
CAMPS, RA .
ULTRAMICROSCOPY, 1986, 19 (03) :279-297
[10]   Effects of electron irradiation in nuclear waste glasses [J].
Sun, K ;
Wang, LM ;
Ewing, RC ;
Weber, WJ .
PHILOSOPHICAL MAGAZINE, 2005, 85 (4-7) :597-608