Surface Oxidation of Indium via Oxygen Ion Bombardment

被引：1

作者：

Ashkhotov, O. G. ^{[1
]}

Khubezhov, S. A. ^{[2
]}

Aleroev, M. A. ^{[1
]}

Ashkhotova, I. B. ^{[1
]}

Magkoev, T. T. ^{[2
]}

机构：

[1] Berbekov Kabardino Balkarian State Univ, Nalchik 360004, Russia

[2] Khetagurov North Ossetian State Univ, Vladikavkaz 362025, Russia

来源：

RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY A | 2019年 / 93卷 / 03期

关键词：

surface; adsorption; indium; oxide; energy; spectroscopy; oxygen; analysis; ions; bond; atoms;

D O I：

10.1134/S0036024419020031

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Auger and X-ray photoelectron spectroscopy are used to analyze surface layers of indium bombarded with 200 eV (5 mu A/cm(2)) oxygen ions. It is shown that after a solid-phase reaction, the indium atoms are in a chemically bound state with oxygen only on the surface.

引用

页码：551 / 554

页数：4

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