Prediction of high-frequency responses in the time domain by a transient scaling approach
被引:0
|
作者:
Li, X.
论文数: 0引用数: 0
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机构:
Beijing Municipal Inst Labor Protect, Beijing Key Lab Environm Noise & Vibrat, Taoranting Rd 55, Beijing 100054, Peoples R ChinaBeijing Municipal Inst Labor Protect, Beijing Key Lab Environm Noise & Vibrat, Taoranting Rd 55, Beijing 100054, Peoples R China
Li, X.
[1
]
机构:
[1] Beijing Municipal Inst Labor Protect, Beijing Key Lab Environm Noise & Vibrat, Taoranting Rd 55, Beijing 100054, Peoples R China
来源:
PROCEEDINGS OF ISMA2016 INTERNATIONAL CONFERENCE ON NOISE AND VIBRATION ENGINEERING AND USD2016 INTERNATIONAL CONFERENCE ON UNCERTAINTY IN STRUCTURAL DYNAMICS
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2016年
基金:
美国国家科学基金会;
关键词:
STATISTICAL ENERGY ANALYSIS;
SYSTEM;
D O I:
暂无
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Many engineering structures are subject to excitations with large amplitudes over a short time duration. These impulsive excitations can cause structural failure or unwanted noise especially in the high-frequency band. This paper presents a transient scaling approach to predict the high-frequency vibration of impulsively excited structures. General scaling laws are derived from the transient statistical energy analysis (TSEA). The similitude between the scaled model and the original system is demonstrated by the equivalence of the TSEA governing equations. Specific forms of the general scaling laws are formulated for a two-oscillator system and a coupled beam system. Computational speedup is achieved from both the reduced order of the original system and the accelerated energy evolution in the scaled model. Numerical validation demonstrates that time domain responses can be obtained efficiently by the transient scaling approach.
机构:
Indian Inst Technol, Embedded Power Management Lab, Dept Elect Engn, Kharagpur 721302, W Bengal, IndiaIndian Inst Technol, Embedded Power Management Lab, Dept Elect Engn, Kharagpur 721302, W Bengal, India
Pal, Avishek
Kapat, Santanu
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机构:
Indian Inst Technol, Embedded Power Management Lab, Dept Elect Engn, Kharagpur 721302, W Bengal, IndiaIndian Inst Technol, Embedded Power Management Lab, Dept Elect Engn, Kharagpur 721302, W Bengal, India
Kapat, Santanu
Jha, Kapil
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机构:
GE Global Res, Power Convers Syst Lab, Bengaluru 560066, IndiaIndian Inst Technol, Embedded Power Management Lab, Dept Elect Engn, Kharagpur 721302, W Bengal, India
Jha, Kapil
Tiwari, Arvind
论文数: 0引用数: 0
h-index: 0
机构:
GE Global Res, Power Convers Syst Lab, Bengaluru 560066, IndiaIndian Inst Technol, Embedded Power Management Lab, Dept Elect Engn, Kharagpur 721302, W Bengal, India
Tiwari, Arvind
THIRTY-THIRD ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2018),
2018,
: 2264
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2270
机构:
Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
Delft Univ Technol, Fac Sci Appl, NL-2600 AA Delft, NetherlandsMichigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
Alles, E. J.
Zhu, Y.
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机构:
Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USAMichigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
Zhu, Y.
van Dongen, K. W. A.
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h-index: 0
机构:
Delft Univ Technol, Fac Sci Appl, NL-2600 AA Delft, NetherlandsMichigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA
van Dongen, K. W. A.
McGough, R. J.
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机构:
Michigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USAMichigan State Univ, Dept Elect & Comp Engn, E Lansing, MI 48824 USA