High power short pulse laser modules for laser produced plasma EUV source

被引:1
作者
Ellwi, S [1 ]
Comley, A [1 ]
Hay, N [1 ]
Brownell, M [1 ]
机构
[1] Powerlase Ltd, Crawley RH10 9RA, W Sussex, England
来源
EMERGING LITHOGRAPHIC TECHNOLOGIES VIII | 2004年 / 5374卷
关键词
EUV source; EUV lithography; lasers; Cost of Ownership; laser produced plasma; xenon; tin;
D O I
10.1117/12.534015
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have recently made significant steps forward in the performance of our laser driver module employed in our laser-produced plasma (LPP) EUV source. We have increased the average power output from the laser whilst minimising the overall Cost of Ownership (COO) and footprint of the system. In addition to minimising the Coo of the laser solution, it is necessary to choose an appropriate target that can attain the overall requirements of EUVL. We are currently investigating solid xenon jets, as well as other target materials, in order to increase the conversion efficiency of the source and therefore further drive down its CoO. We have prepared a source roadmap in response to industry demands, and it shows that the combination of our demonstrated laser technology with available targets will meet the requirements for a production level source.
引用
收藏
页码:145 / 151
页数:7
相关论文
共 50 条
[31]   High power laser-produced plasma source for nano-lithography [J].
Forber, R ;
Gaeta, C ;
Rieger, H ;
Siegert, H ;
McLeod, S ;
Boerger, B .
LASER-GENERATED AND OTHER LABORATORY X-RAY AND EUV SOURCES, OPTICS, AND APPLICATIONS, 2003, 5196 :97-108
[32]   Development of laser-produced plasma based EUV light source technology for HVM EUV lithography [J].
Fujimoto, Junichi ;
Hori, Tsukasa ;
Yanagida, Tatsuya ;
Ohta, Takeshi ;
Kawasuji, Yasufumi ;
Shiraishi, Yutaka ;
Abe, Tamotsu ;
Kodama, Takeshi ;
Nakarai, Hiroaki ;
Yamazaki, Taku ;
Mizoguchi, Hakaru .
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY III, 2012, 8322
[33]   High power and short pulse RF-excited CO2 laser MOPA system for LPP EUV light source [J].
Ariga, T ;
Hoshino, H ;
Miura, T ;
Endo, A .
LASER BEAM CONTROL AND APPLICATIONS, 2006, 6101
[34]   High power EUV lithography sources based on gas discharges and laser produced plasmas [J].
Stamm, U ;
Ahmad, I ;
Balogh, I ;
Birner, H ;
Bolshukhin, D ;
Brudermann, J ;
Enke, S ;
Flohrer, F ;
Gäbel, K ;
Götze, S ;
Hergenhan, G ;
Kleinschmidt, J ;
Klöpfel, D ;
Korobotchko, V ;
Ringling, J ;
Schriever, G ;
Tran, CD ;
Ziener, C .
EMERGING LITHOGRAPHIC TECHNOLOGIES VII, PTS 1 AND 2, 2003, 5037 :119-129
[35]   Laser produced EUV light source development for HVM [J].
Endo, Akira ;
Hoshino, Hideo ;
Suganuma, Takashi ;
Moriya, Masato ;
Ariga, Tatsuya ;
Ueno, Yoshifumi ;
Nakano, Masaki ;
Asayama, Takeshi ;
Abe, Tamotsu ;
Komori, Hiroshi ;
Soumagne, Georg ;
Mizoguchi, Hakaru ;
Sumitani, Akira ;
Toyoda, Koichi .
EMERGING LITHOGRAPHIC TECHNOLOGIES XI, PTS 1 AND 2, 2007, 6517
[36]   Xenon liquid-jet laser-plasma source for EUV lithography [J].
Hansson, BAM ;
Berglund, M ;
Hemberg, O ;
Hertz, HM .
EMERGING LITHOGRAPHIC TECHNOLOGIES IV, 2000, 3997 :729-732
[37]   Liquid-xenon-jet laser-plasma source for EUV lithography [J].
Hansson, BAM ;
Rymell, L ;
Berglund, M ;
Hemberg, O ;
Janin, E ;
Thoresen, J ;
Hertz, HM .
SOFT X-RAY AND EUV IMAGING SYSTEMS II, 2001, 4506 :1-8
[38]   Characterization and optimization of tin particle mitigation and EUV conversion efficiency in a laser produced plasma EUV light source [J].
Yanagida, Tatsuya ;
Nagano, Hitoshi ;
Wada, Yasunori ;
Yabu, Takayuki ;
Nagai, Shinji ;
Soumagne, Georg ;
Hori, Tsukasa ;
Kakizaki, Kouji ;
Sumitani, Akira ;
Fujimoto, Junichi ;
Mizoguchi, Hakaru ;
Endo, Akira .
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY II, 2011, 7969
[39]   A laser produced plasma based reflectometer for EUV metrology [J].
Mrowka, S ;
Underwood, JH ;
Gullikson, E ;
Batson, P .
EMERGING LITHOGRAPHIC TECHNOLOGIES IV, 2000, 3997 :819-822
[40]   Status of the liquid-xenon-jet laser-plasma source for EUV lithography [J].
Hansson, BAM ;
Rymell, L ;
Berglund, M ;
Hemberg, O .
EMERGING LITHOGRAPHIC TECHNOLOGIES VI, PTS 1 AND 2, 2002, 4688 :102-109