Investigation of laser ablation on boron emitters for n-type rear-junction PERT type silicon wafer solar cells

被引：10

作者：

Chen, Jia ^{[1
,2
,4
,5
]}

Deckers, Jan ^{[4
,5
]}

Choulat, Patrick ^{[4
]}

Kuzma-Filipek, Izabela ^{[4
]}

Aleman, Monica ^{[4
]}

De Castro, Angel Uruena ^{[4
]}

Du, Zhe Ren ^{[1
,3
]}

Duerinckx, Filip ^{[4
]}

Hoex, Bram ^{[1
]}

Szlufcik, Jozef ^{[4
]}

Poortmans, Jef ^{[4
,5
,6
]}

Aberle, Armin G. ^{[1
,2
,3
]}

机构：

[1] Natl Univ Singapore, Solar Energy Res Inst Singapore, Singapore 117574, Singapore

[2] Natl Univ Singapore, Grad Sch Integrat Sci & Engn, Singapore 117574, Singapore

[3] Natl Univ Singapore, Elect & Comp Engn, Singapore 117574, Singapore

[4] IMEC, B-3001 Heverlee, Belgium

[5] Katholieke Univ Leuven, B-3001 Heverlee, Belgium

[6] Univ Hasselt, B-3590 Diepenbeek, Hasselt, Belgium

来源：

PROGRESS IN PHOTOVOLTAICS | 2015年 / 23卷 / 12期

基金：

新加坡国家研究基金会;

关键词：

solar cell; laser ablation; laser damage; RECOMBINATION; LIFETIME;

D O I：

10.1002/pip.2604

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

n-type silicon wafer solar cells are receiving increasing attention for industrial application in recent years, such as the n-type rear-junction Passivated Emitter Rear Totally-diffused (PERT) solar cells. One of the main challenges in fabricating the n-PERT solar cells is the opening of the rear dielectric for localized contacts. In this work laser ablation is applied to locally ablate the rear dielectric. We investigate the laser damage to the emitter at the laser-ablated regions using the emitter saturation current density, J(0e,laser),, laser, extracted by two approaches. J(0e), laser is observed to be injection dependent due to high J(02) recombination caused by laser damage to the space charge region. By using the optimized laser ablation parameters, n-PERT solar cells with an efficiency of up to 21.0% are realized. Copyright (C) 2015 John Wiley & Sons, Ltd.

引用

页码：1706 / 1714

页数：9

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