A Novel Incipient Fault Diagnosis Method for Analog Circuits Based on GMKL-SVM and Wavelet Fusion Features

被引:77
作者
Gao, Tianyu [1 ]
Yang, Jingli [1 ]
Jiang, Shouda [1 ]
机构
[1] Harbin Inst Technol, Sch Elect & Informat, Harbin 150001, Peoples R China
关键词
Analog circuits; generalized discriminant analysis (GDA); generalized multiple kernel learning (GKML); incipient fault diagnosis; sine cosine algorithm (SCA); wavelet fusion features; wavelet packet transform (WPT); RIDGELET NETWORK APPROACH; FEATURE-EXTRACTION; SELECTION; MATRIX;
D O I
10.1109/TIM.2020.3024337
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To enhance the reliability of analog circuits in complex electrical systems, a novel incipient fault diagnosis method is presented in this article. The wavelet packet feature quantities, which consist of the energy, fluctuation coefficient, skewness, and margin factor, are obtained via multiscale time-frequency analysis with wavelet packet transform (WPT). Then, generalized discriminant analysis (GDA) is employed to realize the fusion of wavelet packet feature quantities because it can handle the data nonlinearity and eliminate redundant information. Furthermore, the generalized multiple kernel learning support vector machine (GMKL-SVM), which has the advantages of a strong generalization ability and high accuracy, is developed to identify the incipient fault classes of analog circuits. Moreover, a new particle swarm intelligent optimization algorithm, the sine cosine algorithm (SCA), is adopted to optimize key parameters of GMKL-SVM because of its high convergence speed and strong global optimization ability. The method is fully evaluated with the Sallen-Key bandpass filter circuit, the four-op-amp biquad high-pass filter circuit, and the leapfrog filter circuit. The experimental results demonstrate that the proposed incipient fault diagnosis method for analog circuits can produce higher diagnosis accuracy than other typical incipient fault diagnosis methods.
引用
收藏
页数:15
相关论文
共 43 条
[1]   Analog fault diagnosis of actual circuits using neural networks [J].
Aminian, F ;
Aminian, M ;
Collins, HW .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2002, 51 (03) :544-550
[2]   An accurate classifier based on adaptive neuro-fuzzy and features selection techniques for fault classification in analog circuits [J].
Arabi, Abderrazak ;
Bourouba, Nacerdine ;
Belaout, Abdesslam ;
Ayad, Mouloud .
INTEGRATION-THE VLSI JOURNAL, 2019, 64 :50-59
[3]   Generalized discriminant analysis using a kernel approach [J].
Baudat, G ;
Anouar, FE .
NEURAL COMPUTATION, 2000, 12 (10) :2385-2404
[4]   RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits [J].
Binu, D. ;
Kariyappa, B. S. .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 68 (01) :2-26
[5]   An improved SVM classifier based on double chains quantum genetic algorithm and its application in analogue circuit diagnosis [J].
Chen, Peng ;
Yuan, Lifen ;
He, Yigang ;
Luo, Shuai .
NEUROCOMPUTING, 2016, 211 :202-211
[6]  
Cortes C., 2009, 25 C UNCERTAINTY ART, P109
[7]   Research on ELM Soft Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction [J].
Gan Xu-Sheng ;
Qu Hong ;
Meng Xiang-Wei ;
Wang Chun-Lan ;
Zhu Jie .
IEEE ACCESS, 2019, 7 :92517-92527
[8]   A novel fault diagnostic method for analog circuits using frequency response features [J].
Gao, Tian-yu ;
Yang, Jing-li ;
Jiang, Shou-da ;
Yang, Cheng .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (10)
[9]   Recognition of Acoustic Signals of Commutator Motors [J].
Glowacz, Adam .
APPLIED SCIENCES-BASEL, 2018, 8 (12)
[10]   Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation [J].
He, Wei ;
He, Yigang ;
Li, Bing ;
Zhang, Chaolong .
IET SCIENCE MEASUREMENT & TECHNOLOGY, 2019, 13 (02) :318-327